SPAD Single-Photon InGaAs/InP Avalanche Photodiodes APD

The mFVU-3000 FlexLight Dual-Objective Connector Microscope by Viavi is a state-of-the-art inspection solution engineered for high-precision fiber optic connector analysis in demanding manufacturing and research environments. Designed to meet the rigorous standards of next-generation optical networks, this fully automated microscope delivers unmatched imaging clarity, speed, and flexibility—empowering users to detect and resolve defects that compromise performance in AI, HPC, and data center infrastructures.With its dual-objective system, advanced lighting control, and REST API integration, the mFVU-3000 is purpose-built to streamline workflows, reduce test times, and ensure compliance with IEC 61300-3-35 standards. Whether inspecting MPO, VSFF, or legacy connector formats, this microscope provides actionable insights that go far beyond basic pass/fail criteria.Key features: Precision Dual-Objective ImagingThe mFVU-3000 combines 400X high-resolution magnification with a 30X wide field of view, enabling detailed inspection of both individual fiber endfaces and full connector arrays in a single unit. This dual capability ensures comprehensive analysis without the need for manual reconfiguration.Advanced Lighting and Imaging ControlAxial and oblique lighting modes with programmable angle and direction control allow users to distinguish between scratches and contaminants with exceptional clarity. This flexibility enhances defect detection and polish quality assessment.Automated and ScalableWith full automation via open REST API, the mFVU-3000 supports seamless integration into manufacturing environments. It enables programmable workflows, automated pass/fail analysis, and customizable reporting—reducing operator dependency and increasing throughput.Connector VersatilitySupports a wide range of connector types, including PC/APC ferrules from 1 to 64 fibers, and next-gen VSFF formats such as CS, SN, MDC, and MMC. Magnetic quick-connect adapters with auto ID simplify setup and ensure repeatable results.Compliance and Quality AssuranceEnsures full compliance with IEC 61300-3-35 standards, providing real-time, full endface visualization for reliable quality control in high-density optical networks.Applications: Optical component manufacturing: Ensures high-yield production by identifying polish defects and contamination early.AI and HPC infrastructure: Validates high-density parallel optical connectors critical for data-intensive workloads.Data center deployment: Verifies connector integrity to prevent costly downtime and performance degradation.R&D and quality assurance: Provides detailed visual analytics for connector design and process optimization.

The Andarta sensor by Singular Photonics represents a breakthrough in SPAD (Single Photon Avalanche Diode) imaging technology, designed to meet the demanding requirements of modern research and industrial applications. Developed with a focus on flexibility, precision, and scalability, Andarta integrates advanced photon processing capabilities directly into a compact 5mm x 5mm form factor. This sensor is engineered to perform a wide range of imaging tasks, from ultra-high-speed imaging to correlation spectroscopy, making it a versatile tool for scientists and engineers working at the forefront of photonics.Leveraging noiseless performance and highly accurate photon timing, Andarta enables users to extract rich spatial and temporal data from light, even under low-light conditions. Its reprogrammable architecture and support for multiple operational modes allow for tailored imaging workflows, enhancing productivity and enabling new experimental possibilities.Key FeaturesNoiseless Performance: Andarta’s SPAD architecture ensures ultra-low noise levels, enabling precise photon detection even in challenging environments.High Sensitivity in Compact Form: Measuring just 5mm x 5mm, Andarta delivers exceptional sensitivity in a miniature package, ideal for integration into portable and wearable devices.Advanced Photon Processing: Features such as in-pixel histograms and on-chip preprocessing allow for real-time data analysis and reduced post-processing overhead.Multi-Mode Operation: Supports autocorrelation measurements, gated mode, and ultra-high-speed imaging, offering flexibility across diverse imaging scenarios.Reprogrammable Architecture: Users can adapt the sensor’s functionality to specific tasks, enhancing experimental control and scalability.Ideal for Correlation Spectroscopy: Optimized for time-resolved measurements, Andarta is particularly suited for applications requiring precise temporal resolution.Technical SpecificationsFeature SpecificationSensor Type SPAD (Single Photon Avalanche Diode)Form Factor 5mm x 5mmOperational Modes Autocorrelation, Gated Mode, Ultra High-Speed ImagingData Processing In-pixel histograms, On-chip preprocessingReprogrammability YesApplication Focus Correlation Spectroscopy, Wearables, Health ImagingApplicationsAndarta is engineered for use in a wide range of scientific and industrial domains:Biomedical Imaging: High sensitivity and compact size make it ideal for wearable health monitoring and diagnostic devices.Spectroscopy: Time-resolved and autocorrelation capabilities support advanced spectroscopic analysis.Photonics Research: Enables precise photon timing and spatial-temporal imaging for quantum optics and photonics experiments.Industrial Inspection: Suitable for high-speed imaging in automated quality control systems.What's Next?Singular Photonics continues to innovate in SPAD sensor technology, with future developments aimed at expanding pixel arrays, enhancing multispectral capabilities, and integrating AI-driven photon analysis. Researchers and developers are encouraged to explore Andarta’s capabilities and collaborate with Singular Photonics to push the boundaries of what’s possible in photon-based sensing.

Adhesive;Optical Waveguide;Acrylate;300g

1-8 Channels; Max. Sensor Length/Channel 20m (Standard), 50 m (Extended); Measurement Points/m 384 (100 m Sensors), 1,538 (up to 20 m Sensors); Measurement Rate 2.5-250 Hz; Strain Measurement Range ±15,000 µɛ; Temperature Measurement Range -40 to 200 °C; Ethernet Data InterfaceThe ODiSI 7100 Series by Luna Innovations represents a breakthrough in high-definition fiber optic sensing, engineered to meet the rigorous demands of modern materials testing and structural monitoring. Designed for researchers, engineers, and industrial users, this advanced system delivers unparalleled spatial resolution and real-time data acquisition for strain and temperature measurements. With the ability to capture thousands of data points per meter, the ODiSI 7100 enables comprehensive insight into the behavior of materials and systems under dynamic conditions.Unlike traditional point sensors, the ODiSI 7100 leverages distributed sensing technology to provide continuous measurement along the entire length of a fiber optic sensor. This capability is critical for applications requiring high fidelity model validation, process optimization, and structural health monitoring. The system’s passive, dielectric sensors are corrosion-resistant and immune to electromagnetic interference, making them ideal for deployment in challenging environments, including embedded installations and sharply curved surfaces.Key FeaturesThe ODiSI 7100 Series sets a new standard in distributed fiber optic sensing with the following key features:High-definition distributed sensing: Achieve sub-millimeter gage pitch with up to 1,538 measurements per meter, enabling detailed strain and temperature mapping.Multichannel architecture: Supports up to 8 channels, each capable of handling up to 100 meters of sensing fiber, allowing for scalable and flexible deployment.Real-time data acquisition: Provides immediate feedback from demanding environments, facilitating rapid decision-making and process control.Robust sensor design: Flexible, lightweight, and easy to install, the sensors require no electrical power and offer long-term stability without recalibration.Extended reach: Standoff cable lengths of up to 200 meters per channel enable remote sensing in hard-to-access locations.ApplicationsThe versatility and precision of the ODiSI 7100 Series make it suitable for a wide range of technical applications:Advanced materials characterization: Capture strain profiles in composites, metals, and hybrid materials to support R&D and quality assurance.Process optimization: Monitor in-situ temperature distributions to enhance efficiency in manufacturing and energy systems.Finite element model validation: Measure two- and three-dimensional strain fields to verify simulation accuracy.Structural integrity assessment: Detect micro-cracks and defects in aerospace, automotive, and civil infrastructure components.Smart part integration: Embed sensors within materials to create intelligent components capable of self-monitoring.What's Next?The ODiSI 7100 Series is more than a sensor system, it’s a platform for innovation. Whether you're developing next-generation aerospace structures, optimizing battery performance, or validating complex simulations, the ODiSI 7100 delivers the data density and reliability needed to push boundaries. Its seamless integration with Luna’s visualization and analysis software further enhances usability and insight.To explore how the ODiSI 7100 Series can elevate your research or industrial application, contact our sales team today for a personalized consultation or quote. 

Cut off Wavelength 1900 nm; Core Dia. 10 µm; Cladding Dia. 125 µm; Core Absorption >60 dB/mGreitlex Photonics’ TDF-SM-10/125 Thulium-doped single mode (SM) optical fiber is specially designed for highly efficient core pumping at 1550 to 1600 nm. It replaces similar products from former FORC Photonics. Key Features: Thulium-doped Fiber Core Diameter: 10 µm Core Absorption: >60 dB/m Cladding Diameter: 125 µm Cut off Wavelength: 1900 nm Application: Highly Efficient Core Pumping at 1550 to 1600 nm

1250-1650 nm; Responsivity 25 A/W; Breakdown Voltage 40-70 V; Dark Current 1 nA; Package 3-pin TO 46 Wooriro’s APD module for OTDR applications is based on an InGaAs/InP avalanche photodiode (APD) in TO-46 package. This module’s APD is pigtailed, and the module can be ordered either without connector or with a SC, LC or FC type optical connector in UPC or APC version. Designed for an optical wavelength range of 1250 nm to 1650 nm, the APD module for OTDR features a very low dark current of 1 nA typical at 98% breakdown voltage. Typical responsivity is 25 A/W at 1550 nm wavelength and 10 nW optical input power. Key Features: InGaAs/InP Avalanche Photodiode APD Low Dark Current: 1 nA (Typical, @0.98 x Breakdown Voltage) High Reliability Optical Wavelength Range: 1250 nm to 1650 nm Responsivity: 25 A/W Typ. (VAPD = 0.98 VBR, λ = 1550 nm, Pin = 10 nW) Breakdown Voltage VBR: 40 V to 70 V (Id = 10 µA) Temperature Coefficient of VBR: 90 mV/°C (-40 °C to +85 °C) Dimensions: Ø 6 mm x Length 20.2 mm Applications: OTDR; Optical Sensor; Optical Test Instruments