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XIH8800 Crane High Energy X-Ray Line Scan Cameras

Product information "XIH8800 Crane High Energy X-Ray Line Scan Cameras"

Photodiode Detector Array; Pixel Pitch 0.05-1.6 mm; X-Ray Energy 0.05-15 MeV; Scintillator GOS:Tb, CsI:Tl, CWO; Length ≥308 mm; Interface GigE, USB3.0, Camera Link

X-Scan’s XIH8800 Crane series of line scan cameras are designed for high-energy x-ray and gamma-ray scanning applications ranging from 100 keV to 15 MeV energy levels. High-energy accelerators, collimators and detectors such as the XIH8800 are required to image large, dense objects such as metal castings and steel objects whose thickness can range from 25.4 to 305 mm.

Fan-beam collimation minimize the scattering that limits image contrast. A clever compact design combines scintillation (for conversion of high-energy photons to visible light) and fiber optics for conveying the visible light to a shielded off-axis linear imaging photodiode array.

A tungsten housing shields the diode array and camera electronics against scatter and ensures long-life reliability under extreme radiation conditions.

The GigE interface option featuring long cable lengths is recommended for high-energy applications. The XIH8800 Crane high-energy x-ray line scan camera modules include a camera unit, software development kit, power adapter and cabling. An optional frame-grabber which can be installed in the computer is also available.

Key Features:

  • Off-axis, Fiber Optic Design for High-energy Reliability in a Compact Form Factor
  • Energy Range: 50 keV to 15 MeV
  • Choice of Scintillators: GOS:Tb, CsI:Tl, CWO
  • Wide Range of Resolutions & Selection of Lengths
  • Incorporates X-Scan Imaging’s Proprietary Photodiode Arrays
  • Selectable Resolution
  • Low Noise
  • Wide Dynamic Range
  • High Sensitivity
  • High MTF
  • 16-bit Analog-to-Digital Conversion
  • Supports Variable Scan Speed With Position Synchronization
  • Software Development Kit, Including Device Drivers, Libraries and Standard API
  • Interface: Gigabit Ethernet (GigE), Camera Link, USB 3.0

Applications: Industrial Non-destructive Testing (NDT); Weld and Corrosion Inspection; Fan-beam Computed Tomography (CT)

Manufacturer "X-Scan Imaging"
X-Scan Imaging Corporation headquartered in San Jose, California is a full service designer and leading domestic manufacturer of high-performance, buttable, linear photodiode arrays and camera systems using proprietary CMOS semiconductor technology. Designed for both visible and radiation imaging applications, their unique device structure and shielding design offers users reliable high-speed imaging and extended operating lifetime in a broad range of laboratory and on-line production and inspection environments. Typical applications include printed circuit board inspection, quality control, non-destructive testing (NDT), food/pharmaceutical inspection and security/cargo screening.
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XL8800 L-Shaped X-Ray Line Scan Cameras
L-Shaped CMOS Photodiode Detector Array; Pixel Pitch 0.4, 0.8 mm; X-Ray Energy 40-160 kV; Length 822-1,182 mm; Line Period ≥0.35-≥0.9 ms; Scan Velocity ≤0.45-≤1.8 m/s Developed for miscellaneous wheel inspection applications using panoramic x-ray sources, X-Scan Imaging’s XL8800 series of L-shaped x-ray line scan cameras is available in 0.4 and 0.8 mm resolution and with five detector lengths ranging from 822 to 1,182 mm. Other geometries can be provided as special requests. At the heart of the XL8800 L-shaped x-ray line scan cameras are X-Scan Imaging’s CMOS silicon imaging detector array chips providing wide dynamic range, solid-state reliability and high performance. A wide selection of scintillation material converts x-rays into visible light for detection by the imaging array and optimizes both sensitivity and resolution. The close proximity of the analog-to-digital converters (ADC) to the detector chips minimizes interference noise. A collection of hardware for interfacing to computers and software including drivers and an intuitive application programming interface (API) with sample code expedites development of x-ray scanning systems. The XL8800 L-shaped camera is ideal for X-ray wheel inspection applications. Key Features: L-Shape Optimized for Wheel Inspection Length: 822 to 1,182 mm Rounded Corners for Reduced Corner Distortions Integrated X-Scan Imaging Proprietary Detectors Standard Energy Range: 40 to 160 kV Wide Selection of Resolutions: 0.05 to 1.6 mm Software-selectable Resolution Low Noise Wide Dynamic Range High X-Ray Sensitivity High MTF 16-bit Analog-to-Digital Conversion Scan Rates: >2,000 lines/s Variable Scan Speeds With Position Synchronization Maximum Scan Velocity: 0.45 to 1.8 m/s Minimum Line Period: 0.35 to 0.9 ms Software Development Kit, Including Device Drivers, Libraries and Standard API X-Ray Inspection Software With Standard Features Compact & Rugged Housing With Minimal Cabling Modular Design for Expeditious Customization of Length and Shape Applications: Wheel Inspection; X-Ray Inspection Using Panoramic X-Ray Sources
Product number: SW11327
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