XB Series CMOS X-Ray Line Scan Detector Boards

Name: XB Series CMOS X-Ray Line Scan Detector Boards
Brand: X-Scan Imaging
SKU: SW11332
Availability: OutOfStock

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Product number: SW11332

Manufacturer: X-Scan Imaging

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Product information "XB Series CMOS X-Ray Line Scan Detector Boards"

CMOS Photodiode Detector Array; Pixel Size 0.04x0.075 to 1.565x2.4 mm; Resolution 0.05-1.6 mm; 32-6,144 Pixels; Length 51.2-307.2 mm; Scintillator GOS:Tb, CsI:Tl, CdWO4, Other; Data Rate 1 MHz Max.; Dynamic Range >4000

X-Scan Imaging’s XB series are single-chip, buttable silicon CMOS line scan detector boards with on-chip, fully integrated signal processing circuits designed for visible wavelength and x-ray imaging applications.

A scintillator layer is attached to the surface of the photodiode detector array, which converts X-ray photons into visible light. A variety of standard x-ray sensitive scintillator materials are available for applications in industrial inspection, airport security and cargo screening.

Each XB series detector board is configured as a contiguous linear array of photodiodes including a timing generator, digital scanning shift register, an array of charge integrating amplifiers, sample-and-hold circuits and signal amplification chain.

XB series detector boards are designed to permit end-to-end butting on a printed circuit board to form a single longer detector array for extended length scanning applications.

Key Features:

Element Pitch (Resolution) 0.05 to 1.6 mm
Pixel Size: 40 x 75 µm to 1.565 x 2.4 mm
Active Area Length: 51.2 to 307.2 mm
Number of Elements: 32 to 6,144
5 V Power Supply Operation
Simultaneous Integration by Using an Array of Charge Integrating Amplifiers
Sequential Readout With a Digital Scanning Shift Register
Maximum Data Rate: 1 MHz
Integrated CDS Circuits Allow Low Noise and Wide Dynamic Range up to >4000
User-specified Scintillator Material: GOS:Tb, CsI:Tl, CdWO4, etc.
Extended Radiation Hardness Lifetimes (88xxR Series)

Applications: Linear X-Ray Imaging for Industrial and Food Inspection, Homeland Security, Contraband and Cargo Screening, Biological and Industrial CT

Manufacturer "X-Scan Imaging"

X-Scan Imaging Corporation headquartered in San Jose, California is a full service designer and leading domestic manufacturer of high-performance, buttable, linear photodiode arrays and camera systems using proprietary CMOS semiconductor technology. Designed for both visible and radiation imaging applications, their unique device structure and shielding design offers users reliable high-speed imaging and extended operating lifetime in a broad range of laboratory and on-line production and inspection environments. Typical applications include printed circuit board inspection, quality control, non-destructive testing (NDT), food/pharmaceutical inspection and security/cargo screening.

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XU8800 U-Shaped X-Ray Line Scan Cameras

U-Shaped CMOS Photodiode Detector Array; Pixel Pitch 0.4, 0.8 mm; X-Ray Energy 40-160 kV; Length 1,491-4,626 mm; Line Period ≥0.44-≥1.8 ms; Scan Velocity ≤13-≤109 m/min The XU8800 Series “U” shaped Line-scan Camera utilizes the same detector chip technology as the XI8800 Falcon series and provides an ideal solution for tire inspection applications. At the heart of a XU8800 camera are X-Scan Imaging’s CMOS silicon imaging detector array chips providing wide dynamic range and solid-state reliability. The Gigabit Ethernet (GigE) vision interface option provides long cable lengths for convenience. Each XU8800 U-shaped camera system includes a unique camera body, software development kit, power adapter and cabling. A recommended frame-grabber which can be installed in the computer is offered as an option. In a typical tire inspection application, the treads and sidewalls of a rotating tire intersect the x-rays radiating from the x-ray source and directed to the camera body. A wide selection of scintillation materials is available for converting x-ray radiation into visible light for detection by the imaging array, which optimizes both sensitivity and image resolution. Key Features: U-Shape Optimized for Tire Inspection Rounded Corners for Reduced Corner Distortions Integrated X-Scan Imaging Proprietary Detectors Standard Energy Range: 40 to 160 kV, High-energy Versions Available Wide Selection of Resolutions: 0.05 to 1.6 mm Software-selectable Resolution Low Noise Wide Dynamic Range High X-Ray Sensitivity High MTF 16-bit Analog-to-Digital Conversion Scan Rates: >2,000 lines/s Variable Scan Speeds With Position Synchronization Software Development Kit, Including Device Drivers, Libraries and Standard API X-Ray Inspection Software With Standard Features Compact & Rugged Housing With Minimal Cabling Modular Design for Expeditious Customization of Length and Shape Total Detector Length: 1,491 to 4,626 mm Maximum Scan Velocity: 13 to 109 m/min Minimum Line Period: 0.44 to 1.8 ms Applications: Tire Inspection; X-Ray Inspection Using Panoramic X-Ray Sources

Product number: SW11329

REQUEST PRICING AND AVAILABILITY

- Get your individual quote.
- Technical compatibility review included.
- Volume discounts available.

No obligation. Direct access to our engineering team.