Refractive Index Measurement Services

Wavelength Band UV-SWIR, 400-2150 nm; Scalar FEM Numerical Engine; Solution in Seconds; ASCII Fiber Profile Input & Data Output; System Requirements 64-bit MS Windows Based on fiber refractive index profile data, Interfiber Analysis’ “2D Mode Solver” software package computes guided modes and mode properties, fiber bending/coiling effects, as well as mode coupling at splices. The software tool can analyze either 1-dimensional or 2-dimensional fiber index data so it can quantify the impact of any asymmetries in the fiber index profile. With this tool, you can: Compute 2-dimensional fiber modefields and mode properties Predict mode coupling at fiber splices Model fiber bending effects Quantify impact of index profile asymmetries Determine overlap between modes and cores Analyze fiber, preform, or synthetic index profiles These capabilities make the software particularly useful for customers working with high-power optical fibers. It is not only useful for existing IFA-100 users (who can use it to compute modes based on their IFA-100 data,) but also for those who use other equipment as it can be applied to fiber index data from other measurement devices (including preform profilers). This very attractively priced software tool runs on MS Windows 64-bit computers, and unlike other competing software packages, we offer multiple licenses at the customer location for the price of a single purchase. Key Features: System Requirements: MS Windows 64-bit Computer Numerical Engine: Scalar Finite Element Method (FEM) Wavelength Band: UV to SWIR (400 nm to 2150 nm) Solution Domain: 140 µm Diameter Disk Solution Time: Seconds Fiber Profile Input: ASCII Text Files (1- and 2-dimensional) Data Output: ASCII Text, PNG or PDF Images Computed Mode Properties: Electric Field, Optical Intensity, Effective Index, Group Index, Dispersion, Mode Field Diameter, Effective Area Applications: Computing of Guided Modes, Mode Properties, Fiber Bending/Coiling Effects, Mode Coupling at Splices

1260-1620 nm; DOP Accuracy 0.2%, 0.5%; DOP Range 0-100%; DOP Resolution 0.01%; Operating Power Range -40-6dBm General Photonics’ DOP-201 system measures and displays the degree of polarization (DOP) of a light source in real time on the front panel display. The instrument incorporates a patented maximum & minimum search technique that accurately measures both low and high DOP with a wide dynamic range. This technique is superior to polarimeter-based methods that are inaccurate at low values of DOP as well as scrambler-based methods which are less accurate at high values of DOP. The instrument's wide wavelength range includes the S, C and L bands, without calibration. Simultaneous measurement of DOP and optical power level of the light source under test can be used to obtain DOP power dependence and to ensure low insertion loss during depolarizer manufacturing. The DOP-201 degree of polarization meter is ideal for characterizing the performance of depolarizers and depolarized light sources, such as ASE and SLED sources and the pumps for Raman amplifiers. It can also be used to monitor the OSNR (optical signal-to-noise ratio) and PMD (polarization mode dispersion) of optical signals, and to measure the noise figure of optical amplifiers. The DOP-201 features fast measurement, high accuracy and resolution, a wide operating power range, a bright OLED display and an analog output port for easy integration in automated depolarizer manufacturing stations. Key Features: Rapid Measurement Speed: 30 ms Degree of Polarization (DOP) Wavelength Independence High DOP Accuracy: ±0.5% for Single Sample, ±0.2% for 10 Sample Average Wide Operating Wavelength Range: 1260 to 1620 nm DOP Range: 0 to 100% DOP Resolution: 0.01% Operating Power Range: -40 to 6 dBm Front Panel Real-time Display Analog Output Dimensions: 356 x 216 x 89 mm Applications: Characterizing Depolarizers and Depolarized Light Sources, Such as ASE and SLED Sources and the Pumps for Raman Amplifiers; Monitoring OSNR and PMD of Optical Signals; Measuring the Noise Figure of Optical Amplifiers; Depolarizer Manufacturing and QC; Fiber Gyro Coil Characterization; ROADM Manufacturing

600-1620 nm; No. of Channels 1, 2; PER Resolution 0.1 dB; PER Dynamic Range >40, >50 dB; Angular Resolution 0.06 dB; Input Optical Power Range -30-10 dBm; Power Resolution 0.02, 0.2 dB; Measurement Speed 0.1-10 s General Photonics’ ERM-202 is a single or dual channel polarization extinction ratio (PER) meter. When used with a broadband source, it directly measures PER. Single and dual channel models are available. The single channel instrument can be upgraded to a dual-channel version at a later date. The dual channel version is specifically designed to simultaneously measure the PER and power ratio of a device with two polarization maintaining (PM) outputs, such as a Y-branch fiber gyro IOC, PM coupler (PMC), or polarization beam splitter (PBS), as well as evaluate the performance (output DOP) of depolarizers. By combining low-noise circuitry with a high-resolution stepper, the ERM series achieves a PER dynamic range of 50 dB and an angular resolution of 0.06°, outperforming all competitors in its class. These instruments feature OLED displays with a high contrast bright readout that allows the data to be observed from several feet away. The instruments can be operated from the front panel or via remote control. The operator can choose from four measurement speeds ranging from 0.1 to 1 s/cycle to optimize speed or accuracy and can observe multiple parameters on the front panel screen including PER, axis angle, power ratios, and optical power. The measurement data can be stored and recalled for comparison purposes from the front panel as well. Full digital or remote control is included for unattended or system applications. Key Features: One or Two Measurement Channels Free-space Input Front Panel or Remote Control Simultaneous Polarization Extinction Ratio (PER) and Power Ratio Testing PER Resolution: 0.1 dB PER Dynamic Range: >40, >50 dB High Angular Resolution: 0.06 dB Operating Wavelength Range: 1260 to 1620 nm, 960 to 1160 nm, 600 to 850 nm Input Optical Power Range -30 to 10 dBm Power Resolution: 0.02, 0.2 dB Measurement Speed: 0.1 to 10 s Bright OLED Display Store and Recall Functions Dimensions: 356 x 216 x 89 mm Applications: Verification of PM Connectorization and Splices; Testing PM Fiber Coils; Simultaneous Measurement of PER and Power Ratio; Testing Y-branch Fiber Gyro IOCs; Testing PM Couplers (PMC) or Polarization Beam Splitters (PBS); Evaluating the Performance of Depolarizers; Laser Diode PM Fiber Pigtailing; PM Fiber Patchcord Production; PM Fiber Fusion Splicing QA; PM Fiber Coil and Fiber Gyro QA

500 to 1000 nm; Refractive Index Accuracy ±0.0001; Spatial Resolution 500 nm; Fiber Type SM, MM, PM, Other; Fiber Diameter 40 to 400 µm Interfiber Analysis’ IFA-100 multi-wavelength interferometric optical fiber analyzer can measure the refractive index profile of an optical fiber without the need for a cleave at wavelengths from 375 to 2000 nm. By scanning the fiber from the side, the IFA-100 unit allows for scanning and measuring the optical refractive index profile (RIP) along the fiber’s length with sub-micron spatial resolution. The measurement is independent of cumbersome fiber preparation like cleaving and allows for measuring the evolution of the refractive index profile over a given length of fiber. The equipment uses a broadband light source and can determine the refractive index profile at any wavelength between visible and near infrared. The refractive index or index of refraction (IOR) is a property of any material. For optically transmitting materials, such as for fibers and waveguides, it is reflected in the reduced speed of light when travelling through any media other than vacuum. Fibers and waveguides use a distribution of the IOR within their cross section to guide and reflect light, and knowledge of this distribution allows many other critical performance parameters to be calculated, such as mode fields, group and phase propagation constants and fiber dispersion. Based on Interfiber Analysis’ IFA-100 multi-wavelength interferometric optical fiber analyzer, AMS Technologies offers refractive index measurement services for product development, incoming inspection and forensic analysis on optical fibers. Key Features: Multi-wavelength: 500 to 1000 nm No Cleave Required Sub-µm Spatial Resolution: About 500 nm Applicable to Any Fiber Type Fast Measurement Refractive Index Accuracy: ±0.0001 Fiber Diameter: 40 to 400 µm Fiber Material: Silica Glass, Non-silica Glass, Plastic Concentricity Error Measurement: ±200 nm Core Non-circularity Error Measurement: ± 0.4% Fiber Type: Single Mode (SM), Multi Mode (MM), Polarization Maintaining PM), Micro-Structured (PCF), Multicore, Rare-earth, Cladding-pumped, Large Mode Area (LMA), Low Bend Loss, High-Δ, etc. Applications: Measuring Splices, Tapers or Couplers of Any Fiber Type; Test and Measurement; Telecommunication; Lasers

Tensile Test 25 N; Resolution 0.1 N; Pulling Speed 200-1,000 µm/s; Fiber Cladding Diameter 80-400 µm; Fiber Buffer 160-1,000 µm 3SAE Technologies’ LTT Linear Tensile Tester is an automated tension tester for optical fibers with cladding diameters ranging from 80 to 400 μm in diameter. The fiber clamps accommodate coatings up to 1000 μm in diameter. The LTT Linear Tensile Tester incorporates easy, single button fiber loading and an automated tension test process. The built in LCD reports an acceptable "pass" result and maximum tension, in Newtons (N) or Kpsi, applied to the fiber during the tension test. The LTT Linear Tensile Tester also supports destructive testing by pulling and displaying the maximum achieved tension. The built-in LCD and keypad ensure stand-alone operation and provide the operator easy access to software adjustable clamp pressure, maximum tension, tension rate and proof test hold times in ten user selectable and customizable tension programs. These features, in combination with the compact design allow for extreme portability and flexibility for use in laboratory or production environments. The LTT Linear Tensile Tester includes a universal AC to 12 VDC power supply and requires no additional external connections, such as air for operation or a PC for configuration. An available RS-232 port provides the ability to update the firmware and supports data collection from any appropriately configured computer. Key Features: Motorized Clamping System Eliminates Need for External Air Supply Easy Low-maintenance Bench-top Design Built-in Graphical LCD Control (No PC Required) Storage for up to 10 Programs Supported Fiber Buffer: 160 to 1,000 μm Tensile Test: 25 N Resolution: 0.1 N Pulling Speed: 200 to 1,000 μm/s Application: Tensile Test of Optical Fibers with Cladding Diameters of 80 to 400 µm

1250-1650 nm; PDL Dynamic Range 0.015-30 dB; Scan Time <1 s; Insertion Loss <4 dB; Return Loss <-50 dB; Max. Input Power 1 mW OZ Optics’ PDL-100 polarization dependent loss (PDL) meter integrates a sophisticated optoelectronic design with a user-friendly interface. The meter is designed to be insensitive to external optical power drift and generates very low insertion loss fluctuations during a measurement cycle. OZ Optics' PDL-100 PDL meter can be used to measure any pigtailed optical passive components accurately and repeatably, including fiber array wave guides, variable optical attenuators, isolators, couplers, switches and other optical devices. The PDL-100 meter offers the capability of quickly characterizing PDL versus wavelength over a specified wavelength range. This is useful for testing a variety of optical components such as fiber Bragg Gratings. The meter is capable of acquiring and statistically analyzing multiple PDL measurements during a user-adjustable period of time. The PDL-100 polarization dependent loss meter includes a built-in computer using the Windows CE operating system and a color touch screen. The built-in graphical display makes data analysis easy. The unit can be remotely operated via the serial interface port (RS232, RS485) or via a parallel printer port. An optional GPIB to RS232 converter is also available. OZ Optics provides fixed and variable polarization dependent loss emulators. These emulators produce a precise level of polarization dependent loss, from 0.05 to 1dB. These devices can be used as references for calibration if required. OZ Optics also offers polarized fiber optic sources, single mode (SM) patchcords and polarization maintaining (PM) patchcords to complete your test setup. Key Features: Fast Polarization Dependent Loss (PDL) Measurement: Scan Time <1 s Insensitive to External Power Drift Insertion Loss (IL): <4 dB Very Low Variation in Internal Loss (IL): <0.003 dB Wide Wavelength Range Operability: 1250 nm to 1650 nm Swept Wavelength Capability High Resolution Statistical Measurement Analysis Replaceable Detector Receptacles Built-in Graphical Interface With Color Touchscreen Display Optional High-power Versions Large PDL Dynamic Range: 0.015 dB to 30 dB Measurement Method: Random Method as Described in FOTP-157 (TIA/EIA-455-157) Fiber Type: Corning SMF-28 Single Mode (SM) Fiber Accuracy: ±0.005 dB + 5% of PDL Repeatability: ±0.003 dB + 2% of PDL Optical Return Loss (RL): <-50 dB Max. Input Power: 1 mW Display: Color Touch Screen External Controls: RS-232, RS-485 DB-9 type connector, or Parallel Printer Port Operating Temperature: +10°C to +40°C Power Supply Input Voltage: 100 VAC to 240 VAC, 50 Hz to 60 Hz Dimensions: 18 cm x 27 cm x 30 cm Weight: 5 kg Applications: Optical Passive Component Qualification and Testing; Characterization of PDL Dependency Versus Wavelength; Fiber Bragg Grating Qualification; Polarization Dependent Gain (PDG) Measurement of EDFA; Quality Control

1260-1620 nm; Measurement Speed 30 ms; PDL Accuracy ±(0.01 + 5% of PDL) dB; PDL Dynamic Range 0-45 dB; IL Accuracy ±(0.01 + 5% of IL) dB; IL Dynamic Range 0-45 dB; Optical Power Range -40-+6 dBm Using a patented maximum and minimum search method compliant with TIA/EIA-455-198, General Photonics’ PDL/IL multimeter simultaneously measures the polarization dependent loss (PDL), insertion loss (IL) and optical power of devices in just 30 ms. Unlike PDL meters that use the polarization scrambling method with large measurement uncertainty, the PDL-201's max-min technique is useful for both low and high values of PDL. And unlike instruments that use a Mueller Matrix technique, the PDL-201 has a wide wavelength range from 1260 to 1620 nm without calibration. The PDL-201 PDL/IL multimeter comes with USB, Ethernet, GPIB and RS-232 interfaces for PC control and is ideal for fast, accurate characterization of the wavelength dependence of passive devices, especially DWDM and fiber sensor components, in manufacturing environments as well as in laboratories. The PDL-201 features fast measurement, large measurement dynamic range, a bright OLED display and an analog output port. The measurement speed of the instrument combined with the remote control interfaces allow it to work in conjunction with tunable lasers in automatic or semi-automatic test stations. Software to facilitate the integration is also available from AMS Technologies tech support. Key Features: Measurement Speed: 30 ms Wide Wavelength Range: 1260 to 1620 nm High Polarization Dependent Loss (PDL) Accuracy: ±(0.01 + 5% of PDL) dB PDL Dynamic Range: 0 to 45 dB Insertion Loss (IL) Accuracy: ±(0.01 + 5% of IL) dB IL Dynamic Range: 0 to 45 dB Optical Power Range: -40 to +6 dBm Power Meter Function OLED Display and Analog Output Dimensions: 356 x 216 x 89 mm Applications: PDL vs Wavelength Measurements; Characterization of DWDM Devices; Characterization of Fiber Sensor Component