PSGA-101 Polarization Measurement System

Wavelength Band UV-SWIR, 400-2150 nm; Scalar FEM Numerical Engine; Solution in Seconds; ASCII Fiber Profile Input & Data Output; System Requirements 64-bit MS Windows Based on fiber refractive index profile data, Interfiber Analysis’ “2D Mode Solver” software package computes guided modes and mode properties, fiber bending/coiling effects, as well as mode coupling at splices. The software tool can analyze either 1-dimensional or 2-dimensional fiber index data so it can quantify the impact of any asymmetries in the fiber index profile. With this tool, you can: Compute 2-dimensional fiber modefields and mode properties Predict mode coupling at fiber splices Model fiber bending effects Quantify impact of index profile asymmetries Determine overlap between modes and cores Analyze fiber, preform, or synthetic index profiles These capabilities make the software particularly useful for customers working with high-power optical fibers. It is not only useful for existing IFA-100 users (who can use it to compute modes based on their IFA-100 data,) but also for those who use other equipment as it can be applied to fiber index data from other measurement devices (including preform profilers). This very attractively priced software tool runs on MS Windows 64-bit computers, and unlike other competing software packages, we offer multiple licenses at the customer location for the price of a single purchase. Key Features: System Requirements: MS Windows 64-bit Computer Numerical Engine: Scalar Finite Element Method (FEM) Wavelength Band: UV to SWIR (400 nm to 2150 nm) Solution Domain: 140 µm Diameter Disk Solution Time: Seconds Fiber Profile Input: ASCII Text Files (1- and 2-dimensional) Data Output: ASCII Text, PNG or PDF Images Computed Mode Properties: Electric Field, Optical Intensity, Effective Index, Group Index, Dispersion, Mode Field Diameter, Effective Area Applications: Computing of Guided Modes, Mode Properties, Fiber Bending/Coiling Effects, Mode Coupling at Splices

1260-1620 nm; DOP Accuracy 0.2%, 0.5%; DOP Range 0-100%; DOP Resolution 0.01%; Operating Power Range -40-6dBm General Photonics’ DOP-201 system measures and displays the degree of polarization (DOP) of a light source in real time on the front panel display. The instrument incorporates a patented maximum & minimum search technique that accurately measures both low and high DOP with a wide dynamic range. This technique is superior to polarimeter-based methods that are inaccurate at low values of DOP as well as scrambler-based methods which are less accurate at high values of DOP. The instrument's wide wavelength range includes the S, C and L bands, without calibration. Simultaneous measurement of DOP and optical power level of the light source under test can be used to obtain DOP power dependence and to ensure low insertion loss during depolarizer manufacturing. The DOP-201 degree of polarization meter is ideal for characterizing the performance of depolarizers and depolarized light sources, such as ASE and SLED sources and the pumps for Raman amplifiers. It can also be used to monitor the OSNR (optical signal-to-noise ratio) and PMD (polarization mode dispersion) of optical signals, and to measure the noise figure of optical amplifiers. The DOP-201 features fast measurement, high accuracy and resolution, a wide operating power range, a bright OLED display and an analog output port for easy integration in automated depolarizer manufacturing stations. Key Features: Rapid Measurement Speed: 30 ms Degree of Polarization (DOP) Wavelength Independence High DOP Accuracy: ±0.5% for Single Sample, ±0.2% for 10 Sample Average Wide Operating Wavelength Range: 1260 to 1620 nm DOP Range: 0 to 100% DOP Resolution: 0.01% Operating Power Range: -40 to 6 dBm Front Panel Real-time Display Analog Output Dimensions: 356 x 216 x 89 mm Applications: Characterizing Depolarizers and Depolarized Light Sources, Such as ASE and SLED Sources and the Pumps for Raman Amplifiers; Monitoring OSNR and PMD of Optical Signals; Measuring the Noise Figure of Optical Amplifiers; Depolarizer Manufacturing and QC; Fiber Gyro Coil Characterization; ROADM Manufacturing

600-1620 nm; No. of Channels 1, 2; PER Resolution 0.1 dB; PER Dynamic Range >40, >50 dB; Angular Resolution 0.06 dB; Input Optical Power Range -30-10 dBm; Power Resolution 0.02, 0.2 dB; Measurement Speed 0.1-10 s General Photonics’ ERM-202 is a single or dual channel polarization extinction ratio (PER) meter. When used with a broadband source, it directly measures PER. Single and dual channel models are available. The single channel instrument can be upgraded to a dual-channel version at a later date. The dual channel version is specifically designed to simultaneously measure the PER and power ratio of a device with two polarization maintaining (PM) outputs, such as a Y-branch fiber gyro IOC, PM coupler (PMC), or polarization beam splitter (PBS), as well as evaluate the performance (output DOP) of depolarizers. By combining low-noise circuitry with a high-resolution stepper, the ERM series achieves a PER dynamic range of 50 dB and an angular resolution of 0.06°, outperforming all competitors in its class. These instruments feature OLED displays with a high contrast bright readout that allows the data to be observed from several feet away. The instruments can be operated from the front panel or via remote control. The operator can choose from four measurement speeds ranging from 0.1 to 1 s/cycle to optimize speed or accuracy and can observe multiple parameters on the front panel screen including PER, axis angle, power ratios, and optical power. The measurement data can be stored and recalled for comparison purposes from the front panel as well. Full digital or remote control is included for unattended or system applications. Key Features: One or Two Measurement Channels Free-space Input Front Panel or Remote Control Simultaneous Polarization Extinction Ratio (PER) and Power Ratio Testing PER Resolution: 0.1 dB PER Dynamic Range: >40, >50 dB High Angular Resolution: 0.06 dB Operating Wavelength Range: 1260 to 1620 nm, 960 to 1160 nm, 600 to 850 nm Input Optical Power Range -30 to 10 dBm Power Resolution: 0.02, 0.2 dB Measurement Speed: 0.1 to 10 s Bright OLED Display Store and Recall Functions Dimensions: 356 x 216 x 89 mm Applications: Verification of PM Connectorization and Splices; Testing PM Fiber Coils; Simultaneous Measurement of PER and Power Ratio; Testing Y-branch Fiber Gyro IOCs; Testing PM Couplers (PMC) or Polarization Beam Splitters (PBS); Evaluating the Performance of Depolarizers; Laser Diode PM Fiber Pigtailing; PM Fiber Patchcord Production; PM Fiber Fusion Splicing QA; PM Fiber Coil and Fiber Gyro QA

500 to 1000 nm; Refractive Index Accuracy ±0.0001; Spatial Resolution 500 nm; Fiber Type SM, MM, PM, Other; Fiber Diameter 40 to 400 µm Interfiber Analysis’ IFA-100 multi-wavelength interferometric optical fiber analyzer can measure the refractive index profile of an optical fiber without the need for a cleave at wavelengths from 375 to 2000 nm. By scanning the fiber from the side, the IFA-100 unit allows for scanning and measuring the optical refractive index profile (RIP) along the fiber’s length with sub-micron spatial resolution. The measurement is independent of cumbersome fiber preparation like cleaving and allows for measuring the evolution of the refractive index profile over a given length of fiber. The equipment uses a broadband light source and can determine the refractive index profile at any wavelength between visible and near infrared. The refractive index or index of refraction (IOR) is a property of any material. For optically transmitting materials, such as for fibers and waveguides, it is reflected in the reduced speed of light when travelling through any media other than vacuum. Fibers and waveguides use a distribution of the IOR within their cross section to guide and reflect light, and knowledge of this distribution allows many other critical performance parameters to be calculated, such as mode fields, group and phase propagation constants and fiber dispersion. Based on Interfiber Analysis’ IFA-100 multi-wavelength interferometric optical fiber analyzer, AMS Technologies offers refractive index measurement services for product development, incoming inspection and forensic analysis on optical fibers. Key Features: Multi-wavelength: 500 to 1000 nm No Cleave Required Sub-µm Spatial Resolution: About 500 nm Applicable to Any Fiber Type Fast Measurement Refractive Index Accuracy: ±0.0001 Fiber Diameter: 40 to 400 µm Fiber Material: Silica Glass, Non-silica Glass, Plastic Concentricity Error Measurement: ±200 nm Core Non-circularity Error Measurement: ± 0.4% Fiber Type: Single Mode (SM), Multi Mode (MM), Polarization Maintaining PM), Micro-Structured (PCF), Multicore, Rare-earth, Cladding-pumped, Large Mode Area (LMA), Low Bend Loss, High-Δ, etc. Applications: Measuring Splices, Tapers or Couplers of Any Fiber Type; Test and Measurement; Telecommunication; Lasers

Tensile Test 25 N; Resolution 0.1 N; Pulling Speed 200-1,000 µm/s; Fiber Cladding Diameter 80-400 µm; Fiber Buffer 160-1,000 µm 3SAE Technologies’ LTT Linear Tensile Tester is an automated tension tester for optical fibers with cladding diameters ranging from 80 to 400 μm in diameter. The fiber clamps accommodate coatings up to 1000 μm in diameter. The LTT Linear Tensile Tester incorporates easy, single button fiber loading and an automated tension test process. The built in LCD reports an acceptable "pass" result and maximum tension, in Newtons (N) or Kpsi, applied to the fiber during the tension test. The LTT Linear Tensile Tester also supports destructive testing by pulling and displaying the maximum achieved tension. The built-in LCD and keypad ensure stand-alone operation and provide the operator easy access to software adjustable clamp pressure, maximum tension, tension rate and proof test hold times in ten user selectable and customizable tension programs. These features, in combination with the compact design allow for extreme portability and flexibility for use in laboratory or production environments. The LTT Linear Tensile Tester includes a universal AC to 12 VDC power supply and requires no additional external connections, such as air for operation or a PC for configuration. An available RS-232 port provides the ability to update the firmware and supports data collection from any appropriately configured computer. Key Features: Motorized Clamping System Eliminates Need for External Air Supply Easy Low-maintenance Bench-top Design Built-in Graphical LCD Control (No PC Required) Storage for up to 10 Programs Supported Fiber Buffer: 160 to 1,000 μm Tensile Test: 25 N Resolution: 0.1 N Pulling Speed: 200 to 1,000 μm/s Application: Tensile Test of Optical Fibers with Cladding Diameters of 80 to 400 µm

1250-1650 nm; PDL Dynamic Range 0.015-30 dB; Scan Time <1 s; Insertion Loss <4 dB; Return Loss <-50 dB; Max. Input Power 1 mW OZ Optics’ PDL-100 polarization dependent loss (PDL) meter integrates a sophisticated optoelectronic design with a user-friendly interface. The meter is designed to be insensitive to external optical power drift and generates very low insertion loss fluctuations during a measurement cycle. OZ Optics' PDL-100 PDL meter can be used to measure any pigtailed optical passive components accurately and repeatably, including fiber array wave guides, variable optical attenuators, isolators, couplers, switches and other optical devices. The PDL-100 meter offers the capability of quickly characterizing PDL versus wavelength over a specified wavelength range. This is useful for testing a variety of optical components such as fiber Bragg Gratings. The meter is capable of acquiring and statistically analyzing multiple PDL measurements during a user-adjustable period of time. The PDL-100 polarization dependent loss meter includes a built-in computer using the Windows CE operating system and a color touch screen. The built-in graphical display makes data analysis easy. The unit can be remotely operated via the serial interface port (RS232, RS485) or via a parallel printer port. An optional GPIB to RS232 converter is also available. OZ Optics provides fixed and variable polarization dependent loss emulators. These emulators produce a precise level of polarization dependent loss, from 0.05 to 1dB. These devices can be used as references for calibration if required. OZ Optics also offers polarized fiber optic sources, single mode (SM) patchcords and polarization maintaining (PM) patchcords to complete your test setup. Key Features: Fast Polarization Dependent Loss (PDL) Measurement: Scan Time <1 s Insensitive to External Power Drift Insertion Loss (IL): <4 dB Very Low Variation in Internal Loss (IL): <0.003 dB Wide Wavelength Range Operability: 1250 nm to 1650 nm Swept Wavelength Capability High Resolution Statistical Measurement Analysis Replaceable Detector Receptacles Built-in Graphical Interface With Color Touchscreen Display Optional High-power Versions Large PDL Dynamic Range: 0.015 dB to 30 dB Measurement Method: Random Method as Described in FOTP-157 (TIA/EIA-455-157) Fiber Type: Corning SMF-28 Single Mode (SM) Fiber Accuracy: ±0.005 dB + 5% of PDL Repeatability: ±0.003 dB + 2% of PDL Optical Return Loss (RL): <-50 dB Max. Input Power: 1 mW Display: Color Touch Screen External Controls: RS-232, RS-485 DB-9 type connector, or Parallel Printer Port Operating Temperature: +10°C to +40°C Power Supply Input Voltage: 100 VAC to 240 VAC, 50 Hz to 60 Hz Dimensions: 18 cm x 27 cm x 30 cm Weight: 5 kg Applications: Optical Passive Component Qualification and Testing; Characterization of PDL Dependency Versus Wavelength; Fiber Bragg Grating Qualification; Polarization Dependent Gain (PDG) Measurement of EDFA; Quality Control

1260-1620 nm; Measurement Speed 30 ms; PDL Accuracy ±(0.01 + 5% of PDL) dB; PDL Dynamic Range 0-45 dB; IL Accuracy ±(0.01 + 5% of IL) dB; IL Dynamic Range 0-45 dB; Optical Power Range -40-+6 dBm Using a patented maximum and minimum search method compliant with TIA/EIA-455-198, General Photonics’ PDL/IL multimeter simultaneously measures the polarization dependent loss (PDL), insertion loss (IL) and optical power of devices in just 30 ms. Unlike PDL meters that use the polarization scrambling method with large measurement uncertainty, the PDL-201's max-min technique is useful for both low and high values of PDL. And unlike instruments that use a Mueller Matrix technique, the PDL-201 has a wide wavelength range from 1260 to 1620 nm without calibration. The PDL-201 PDL/IL multimeter comes with USB, Ethernet, GPIB and RS-232 interfaces for PC control and is ideal for fast, accurate characterization of the wavelength dependence of passive devices, especially DWDM and fiber sensor components, in manufacturing environments as well as in laboratories. The PDL-201 features fast measurement, large measurement dynamic range, a bright OLED display and an analog output port. The measurement speed of the instrument combined with the remote control interfaces allow it to work in conjunction with tunable lasers in automatic or semi-automatic test stations. Software to facilitate the integration is also available from AMS Technologies tech support. Key Features: Measurement Speed: 30 ms Wide Wavelength Range: 1260 to 1620 nm High Polarization Dependent Loss (PDL) Accuracy: ±(0.01 + 5% of PDL) dB PDL Dynamic Range: 0 to 45 dB Insertion Loss (IL) Accuracy: ±(0.01 + 5% of IL) dB IL Dynamic Range: 0 to 45 dB Optical Power Range: -40 to +6 dBm Power Meter Function OLED Display and Analog Output Dimensions: 356 x 216 x 89 mm Applications: PDL vs Wavelength Measurements; Characterization of DWDM Devices; Characterization of Fiber Sensor Component

1290-1650 nm; No. of Channels 1; PER Resolution 0.01 dB; PER Dynamic Range 47 dB; Angular Resolution 0.3°; Input Optical Power Range 50-1000 µW; Source Output Power 1 mW OZ Optics has bundled its polarized sources, polarization extinction ratio meters and master reference patchcords into the PER-KIT – one complete test set for rapid testing of the polarization maintaining properties of optical components. We offer systems for testing devices terminated with connectors, as well as systems for testing the polarization properties of V-Groove arrays. For standard components, the extinction ratio measurement system includes a polarized source with a rotatable polarizer, a polarization extinction ratio meter, a quick connect adaptor for the extinction ratio meter, and a reference polarization maintaining patchcord. For V-Groove arrays, OZ Optics offers an OEM version of the polarization measurement system (manual operated type and semi-automated type). The test set includes the polarized source with rotatable polarizer, an OEM version of the extinction ratio meter with external optics, a V-Groove mount with a three-axis position system, with one axis motorized for semi-automated type, a reference V-Groove array with a single PM fiber, and an application software package for semi-automated type. The user only has to supply a Windows-based computer to operate the system as a semi-automated test bed. Key Features: Measures Extinction Ratios up to 40 dB Complete Kit for Extinction Ratio (ER) Measurement Simple Operation Key Features PFOSS-02 Polarized Sources: Laser Type: Fabry-Perot Laser Central Wavelength: 1550 nm ±20 nm, 1310 nm ±20 nm Extinction Ratio: 40 dB, 35 dB Output Power: 1 mW Polarizer Type: Rotatable Spectral Bandwidth: <5 nm Short Term Stability: ±0.05 dB Long Term Stability: ±0.1 dB Connector Type: Standard, Super, Ultra NTT-FC/PC Receptacle Power Variation Induced by Rotatable Polarizer: <0.25 dB Supply Voltage: Universal 110/220 VAC to DC Adapter Dimensions: 76 x 63 x 70 mm Key Features ER-100 Extinction Ratio Meter: Wavelength Range: 1290 nm to 1650 nm Extinction Ratio Range: 40 dB (for 1290 nm to 1650 nm) Dynamic Range: 47 dB Polarization Extinction Ratio Accuracy: ±1 dB Polarization Extinction Ratio Resolution: 0.01 dB Angular Accuracy: ±0.5° Angular Resolution: 0.3° Update Rate (Extinction Ratio): 2.7 Hz Update Rate (Relative Power): 650 Hz Input Optical Power: 50 μW to 1.0 mW Communication Interface: RS232 Supply Voltage: Universal 110/220V VAC to DC Adapter, 50/60 Hz Dimensions: 60 x 90 x 190 mm Weight: 0.5 kg (5 kg for V-Groove Array Measurement Test Set) Operating Temperature: +10°C to +50°C Regulatory Compliance: Complies With EMC (EN61326:1997 & A1:1998) and Safety Requirements (EN61010-1:1993, A2:1995) Applications: Fiber Optic Component Manufacturing; Automated Alignment; Quality Control and Measurement; Product Development; Component or System Troubleshooting

 1280-1620 nm; SOP Uncertainty ±0.25°; DOP Uncertainty ±2%, ±0.5%; PER Measurement Range 0-40 dB; Polarization Sampling Rate 4 MHz; Analog Bandwidth ≤1 MHz General Photonics’ POD-201 is an FPGA-powered polarimeter designed for high-speed polarization analysis and monitoring. The instrument uses four channels to simultaneously obtain the four Stokes parameters and measure the instantaneous state of polarization (SOP) and degree of polarization (DOP) of an input light beam. The POD-201 polarimeter is controlled with FPGAs that support sampling rates of up to 4 MS/s. A USB 2.0 interface enables data to be transferred directly to a computer at a rate up to 30 MB/s. The POD-201 also features data logging function for long term measurement of polarization changes of up to 1 billion points. In addition to the front panel controls, the unit can be controlled remotely via the USB 2.0 interface. The POD-201 comes with PolaView™ software for real-time graphic display of polarization state either on a Poincaré Sphere window for viewing SOP traces or on an oscilloscope window for monitoring polarization changes over time. The POD-201 polarimeter can be quickly and easily calibrated using its built-in self-calibration program to optimize DOP and SOP accuracies at special wavelengths and temperatures. With a suitable light source and measurement techniques, it can be used to measure polarization extinction ratio (PER) to aid in aligning PM fiber to laser sources. Further features include long-term SOP monitoring, SOP markers for angle measurement, a "SOP replay" function in sphere display mode, extended triggering capability in oscilloscope mode, an OLED display for easy setup and data display and a configurable analog SOP/DOP/power output for easy integration with automated test systems. The standard configuration is a two-port inline version, to monitor a signal without interruption. Key Features: Self-calibration Program to Optimize Degree of Polarization (DOP) and State of Polarization (SOP) Accuracies at Arbitrary Wavelengths and Temperatures OLED Display for Setup and Data Display Real-time Poincaré Sphere Display Analog SOP/DOP/Power Output for ATE Integration Data Logging of SOP up to 1 Billion Points SOP Uncertainty: ±0.25° After User Calibration DOP Uncertainty: ±2% (Built-in Calibration), ±0.5% (After User Calibration) PER Measurement Range: 0 to 40 dB Polarization Sampling Rate: 4 MHz Analog Bandwidth: ≤1 MHz Operating Wavelength Range: 1440 to 1620 nm; 1280 to 1340 nm Polarization Dependent Loss (PDL): <0.25 dB Insertion Loss (IL): ≤1.2 dB Return Loss (RL): 45, 55 dB Polarization Mode Dispersion (PMD): <0.1 ps Continuous Measurement External Trigger Long-term Polarization Monitoring Applications: 100G System Polarization Test; SOP/DOP Monitoring; Polarization Stabilization; Polarization Analysis; Scrambler DOP Characterization; SOP Statistics; PM Fiber Alignment to Light Sources

Measurement of 1-D, 2-D, 3-D Fiber Refractive Index Profiles; No Costly Instrument Purchase; 500 to 1000 nm; Refractive Index Accuracy ±0.0001; Spatial Resolution 500 nm Based on Interfiber Analysis’ IFA-100 multi-wavelength interferometric optical fiber analyzer, AMS Technologies offers refractive index measurement services for product development, incoming inspection and forensic analysis on optical fibers. At our testing facility in Munich we can secure quick sample turnaround and offer confidentiality of measurement results. The refractive index profile allows determination of key transmission parameters like chromatic dispersion, mode field diameter, bandwidth, birefringence and polarization mode dispersion (PMD). Line plots and tomography scans: The measurements can be taken in one dimension giving a line plot of the refractive index at any given cross section of the fiber. This measurement assumes the fiber to be symmetrical, and symmetrical geometry is assumed for the computation of the refractive index profile. For the two-dimensional measurements, several lower-dimensional projections are combined to form a full surface profile of the refractive index. This computer tomography based approach does not take assumptions for the fibers being symmetric. Environmental testing solution: The interferometry measurement technique used in the setup does not require external calibration. Measurements can be done with fiber diameters from 40 to 400 µm within a measurement wavelength from 500 to 1000 nm. Fiber material can be silica glass, non-silica glass or plastic. The accuracy of index of refraction is ±0.0001, accuracy of stress measurement is ±5 MPa. Contact AMS Technologies’ fiber property measurement experts to find out how our refractive index measurement services can solve your measurement challenges! Key Features: Measurement of 1-D, 2-D, and Even 3-D Fiber Refractive Index Profiles No Costly Instrument Purchase Rapid Turnaround Experienced Measurement Staff Any Fiber Type: Single Mode (SM), Multi Mode (MM), Polarization Maintaining PM), Micro-Structured (PCF), Multicore, Rare-earth, Cladding-pumped, Large Mode Area (LMA), Low Bend Loss, High-Δ, etc. Any Fiber Material: Silica, Non-silica, Plastic Any Fiber Diameter From 40 to 750 μm Any Measurement Wavelength From 500 to 1000 nm Sub-μm Fiber Geometry Measurements Sample Lengths Can be as Sort as Centimeters Refractive Index Accuracy: ±0.0001 Sub-µm Spatial Resolution: About 500 nm No Cleave Required Fiber Diameter: 40 to 400 µm Fiber Material: Silica Glass, Non-silica Glass, Plastic Concentricity Error Measurement: ±200 nm Core Non-circularity Error Measurement: ± 0.4% Applications: One-Dimensional Refractive Index Measurement; Two-Dimensional Refractive Index Measurement; One-Dimensional Stress Measurement; Three-Dimensional Refractive Index Measurement