Filters and Mirrors for Laser Applications

 0.7-6.0 µm; Transmittance >65%->85%; FWHM 42-190 nm; Diameter 25 mm; Thickness 0.5 mm; Surface Quality <60-40 Scratch-Dig  Vortex designs and makes a wide range of IR filters with center wavelengths from 0.7 µm to 6.0 µm. While traditionally thermal evaporation has been used for IR filters, Vortex IR filters are deposited by sputtering using the supplier’s “Rockard”© technology.  Sputter deposition has a process energy approximately three times that of thermal evaporation, leading to the filters’ densely packed structure. This technology ensures the following superior environmental and optical properties: Highly durable coatings suitable for the toughest environments Extremely low temperature shift Reduced passband ripple for even response High blocking efficiency to increase signal to noise ratio All IR filters are sold as 25mm diameter, 0.5mm thick and exhibit high angular tolerance, extremely low change with temperature and very high resistance to thermal shock.  AMS offers Vortex’s wide range of ‘standard’ narrow band IR filters for detection of common gases, chemicals and materials. For details and specifications see below: Standard Narrow Band Filters       Part Number CWL (nm) Transmittance FWHM (nm) Suggested Use NBP-1940-42-25 1940 nm (±8 nm) >85% 42 nm (±5 nm) H2O (Water) NBP-3055-145-25 3055 nm (±16 nm) >75% 145 nm (±17 nm) C2H2 (Acetylene) NBP-3260-150-25 3260 nm (±16 nm) >75% 150 nm (±17 nm) C2H4 (Ethylene) NBP-3330-150-25 3330 nm (±15 nm) >75% 150 nm (±15 nm) CH4 (Methane) NBP-3349-70-25 3349 nm (±15 nm) >75% 70 nm (±15 nm) C2H6 (Ethane) NBP-3400-155-25 3400 nm (±15 nm) >75% 155 nm (±15 nm) (HC) General Hydrocarbon NBP-3900-180-25 3900 nm (±18 nm) >75% 180 nm (±20 nm) (Reference) NBP-4000-180-25 4000 nm (±18 nm) >75% 180 nm (±15 nm) (Reference) NBP-4260-160-25 4260 nm (±20 nm) >70% 160 nm (±21 nm) CO2 (Carbon Dioxide) NBP-4530-85-25 4530 nm (±20 nm) >75% 85 nm (±10 nm) N2O (Nitrous Oxide) NBP-4660-165-25 4660 nm (±15 nm) >75% 165 nm (±15 nm) CO (Carbon Monoxide) NBP-5330-190-25 5330 nm (±25 nm) >65% 190 nm (±25 nm) NO (Nitrogen Monoxide)   General IR filters and coatings are available for applications such as non-contact temperature measurement, filter wheels and machine vision. For details and specifications see below: General IR Filters and Coatings       Part Number Transmission Peak Blocking Range Suitable Detectors Description BPF-VIST-IRBL-25 70% Ave. for 400-600 nm 0.65-5 µm+  Si Photodiode Type Visible Transmission from 400 nm to 600 nm and Blocking for Near-IR and Mid-IR BPF-1.3-2.5-25 90% Ave. for 1.3-2.5 µm UV and Visible to 1.2 µm, 2.6-3.8 µm PbS, MCT and Boltometer Type Transmits from 1.3 µm to 2.5 µm and Blocks Outside this Range SWP-1.4-2.6-25 90% Ave. for 1.4-2.6 µm 2.75-20 µm PbSe, MCT and Boltometer Type 90% Average Transmission for 1.4 µm to 2.6 µm, Blocks from 2.7 µm to 20 µm LWP-1.65-25 90% Ave. in Pass Band UV, Visible + Desired Part of IR PbS, MCT and Boltometer Type Long Wave Pass Filter, Transmits Above 1.65 µm and Blocks Below Back to UV BPF-2070-2510-25 90% Ave. For 1070-2510 nm, 60% @2050 nm and 2550 nm ±1% UV and Visible to 2.0 µm and 2.7-20 µm+ PbS, InGaAs and Boltometer Type Mid IR Wide Band Pass Filter for 2070 nm to 2500 nm, Used for Non-contact Temperature Measurement BPF-3.0-5.0-25-Si >90% Ave. 3-5 µm Band UV and Visible to 2.8 µm and 5.3-7.5 µm PbSe, MCT and Boltometer Type 90% Average Transmission from 3 µm to 5 µm, Blocks Outside this Range to 7.5 µm on Silicon BPF-3.0-5.0-25-SAP >90% Ave. 3-5 µm Band UV and Visible to 2.8 µm and 5.3-7.5 µm PbSe, MCT and Boltometer Type 90% Average Transmission from 3 µm to 5 µm, Blocks Outside this Range to 20 µm on Sapphire   Custom filters can be manufactured with short lead-times, contact the AMS Technologies filter experts today to discuss a customized filter solution tailored to your application’s requirements. Key Features: Center Wavelength Range: 0.7 µm to 6.0 µm Typical Bandwidth (FWHM): 42 nm to 190 nm Transmittance: >65% to >85% Diameter: 25 mm Thickness: 5 mm Surface Quality: <60-40 Scratch-Dig Highly Durable and Suitable for the Toughest Environments (RockArd© Deposition Technology) High Angular Tolerance Extremely Low Change With Temperature Very High Resistance to Thermal Shock Applications: Detection of Common Gases and Materials Like H2O, C2H2, C2H4, C2H6, HC, CO2, N2O, CO, NO; Non-contact Temperature Measurement; Filter Wheels, Machine Vision

1040 nm; Pulse Energy 5->35 nJ; Pulse Repetition Frequency 100 MHz; Pulse Duration <150 fs; Output Power ≤0.5 ->3.5 W Chromacity 1040 is a reliable, fixed wavelength, femtosecond laser source for two-photon microscopy that delivers ultrashort pulses with high average powers in the near-IR. Chromacity’s fiber-based femtosecond laser source allows to exploit the well-known advantages of Yb-doped fibers as gain media, while delivering high quality and high-power ultrashort pulses. The 1040 nm femtosecond laser is ideal for multiphoton excitation (MPE) by coupling into microscope systems, empowering users to produce clear and high-resolution images, as a result of its excellent beam quality, ultrafast pulses and high average power levels. Learn how the femtosecond laser source is ideal for two-photon microscopy. The Chromacity 1040 femtosecond laser is engineered with a custom-designed and temperature-controlled baseplate, providing an unprecedented level of ruggedness and reliability for this type of laser architecture. The Chromacity 1040 is the next generation in femtosecond laser systems, which no longer need hours in set-up time. The light emitted from the laser originates from a single mode fiber, ensuring superior beam quality. This laser source does not require water cooling and comes with a simple user interface, making it one of the easiest laser sources to operate. Key Features: Compact Laser Housing Air-cooled Operation Intuitive Web Browser Interface Power-efficient Laser Cavity (Low Power Consumption) Low-, Mid-, and High-Power-Versions Available Output Power: ≤0.5 W (Low-Power), 2.5 W (Mid-Power), >3.5 W (High-Power) Wavelength: 1030 nm (Low-Power, 1040 nm (Mid-Power, High-Power) Pulse Duration: <150 fs (Chirped Output Pulse Option Available) Pulse Energy: 5 nJ (Low-Power), 25 nJ (Mid-Power), >35 nJ (High-Power) Pulse Repetition Frequency: 100 MHz (Other Repetition Frequencies Available) Beam Parameters: Free Space, M2 <1.2, Linearly Polarized, Divergence <2 mrad TEM00 Beam Ideal for Coupling into a Range of Microscopes Beam Diameter: 0.5 mm to 1.2 mm Control Interface: Web Browser Interface, Ethernet and Serial Port (RS232) Also Available Cooling: Air-cooled Electrical: 110-240 VAC, 50-60 Hz, 80 W Dimensions 1040 Module: 426 mm x 250 mm x 108 mm (LxWxH) Dimensions Control Unit: 483 mm x 285 mm x 88 mm (LxWxH, 19’’ 2U Rack-mount) Applications: SHG and Multi-photon Microscopy; Light Sheet Microscopy; Optogenetics Imaging Experiments; Pump Source for Non-linear Optics (OPOs, SHG); THz Generation; Supercontinuum Generation; Time Resolved Experiments (e.g. TCSPC/FLIM)