Alignment Solutions

Detector Type Si, IR-Enhanced Si, InGaAs, UV-Enhanced InGaAs, CMOS; 190-2700 nm; Beam Size 0.5-45,000 µm; Power Range 100 µW - 8 kW; Interface USB, USB 2.0, Other Duma Optronics offers a comprehensive series of beam analyzers based on technologies such as scanning knife-edge with tomographic beam reconstruction. The series’ wide spectral range is unprecedented for a single detector, ranging from 200 to 1600 nm and even further on to 2700 nm. High-power beam analyzers are available for testing high-power laser beams used for material processing. These HP models allow online measuring of beam profile and absolute power, measurement of M² and accurate location of beam waist for laser printing technology. Duma Optronics’ series of beam analyzers is capable of analyzing beam sizes from under 0.5 µm up to 45 mm and feature a full set of attachments for M² measurement and other sophisticated applications. BeamOn 2 MP: Best cost-effective system for high-resolution laser beam measurement, especially for focused beams. Key Features are 2 Megapixel resolution, 3 µm per pixel and down to 60 µm beam size. Download datasheet BeamOn WSR: This beam analyzer is based on a proprietary technology measuring from UV to 1550 nm with camera technology. For BeamOn WSR, a complete set of accessories is available, including a built-in motorized filter wheel. Download datasheet BeamOn LA: A beam diagnostics measurement system for real-time measurement of continuous or pulsed large laser beams (up to 45 mm). Download datasheet µBeam: The analyzer for microscopic beams: A beam diagnostics measurement system for real-time measurement and display of small CW or pulsed lasers in the sub-micron range, fiber optic and laser diode beam profiles. Download datasheet BeamOn U3-E: This 2.35 Megapixel wide spectral range detector is capable of measuring beams up to 1350 nm with a full setup of accessories for various applications. A version for ultraviolet (UV) wavelengths is available on request. Download datasheet LAM Beam Analyzer: New instrument especially designed for LAM (Laser Additive Manufacturing). Measuring critical parameters such as beam size, accurate beam position and power. Download datasheet Beam Analyzer HP: High-power measurements up to 5 kW based on beam sampler technology combined with pressurized air cooling will measure beam profile in real time and relative power fluctuation. Download datasheet BeamOn U3 HP: A full-power measurement system based on a high-resolution camera combined with Duma Optronics’ our patented technology of sampling and cooling will measure up to IR wavelengths of 1.6 microns. Download datasheet BeamOn HP: Simplified version of beam analysis when compared to BeamOn U3, offering an excellent price-performance ratio. Download datasheet Microbeam HP: A unique microbeam analyzer for relatively small focused beams down to less than 5 µm with power levels exceeding 100 W. Download datasheet Key Features: Complete Line of Laser Beam Analyzing Suitable for CW and/or Pulsed Lasers Two Technologies: Tomographic Knife-edge and CCD/CMOS Imaging Systems Wide Range of Beam Sizes: 0.5 to 45,000 µm Broad Wavelength Ranges From UV to 2700 nm High-power (HP) Models Available Full Set of Attachments for M² Measurement and Other Sophisticated Applications Applications: Analyzing CW and Pulsed Laser Beams, Providing Profiles, Beam Size, Beam Position and Real-time Power Measurements. Analyzing Beams With Sizes Ranging From Less Than 0.5 µm up to 45 mm; Analyzing Laser Beams With Power Levels From pW up to Several W, High Power Versions up to 8 kW; Special Versions for Solar Energy

Sensor Size 4 x 4 - 100 x 80 mm; 350-1100 nm; Power Range 1-2,500 µW; Position Resolution 0.1-100 µm; Position Accuracy 25-1,000 µm; Interface Analog, USB 2.0, Mobile Lasers propagating through space have a perfect line trajectory. Using this quality, combined with a position sensor capable of measuring perpendicularly to the propagation direction, Duma Optronics’ comprehensive series of beam positioners yields a perfect system for straightness and alignment. Many applications such as machine straightness measurement, alignment of optical systems, vibration and quality control are enabled by combining the system with the powerful computing capability of today. Optical beam position measurements can be done by a variety of sensor heads, including CCD or miniature and large-area PSD. Duma Optronics offers a variety of sensor head sizes to accommodate numerous application needs. Position sensing provides measurements of optical beam location on a detector surface, and also provides absolute power measurements. Duma Optronics’ series of laser beam positioners are measuring accurately down to fractions of a micron, wherein lower resolution allows measurements over wide areas up to 100 mm. This series includes various detector types such as lateral effect, centrally perforated four-quadrant in 4 x 4 mm up to 100 mm size, and CCD. SpotOn Analog: A complete solution for fast and extremely accurate beam positioning. The system measures both optical beam position and power. Download datasheet SpotOn Mobile: High-accuracy compact beam positioning system with Nexus7 PC tablet included. Download datasheet LaserOn: Compact visible laser diode (635 nm) with built-in screws for fine beam direction adjustment. Completing usage for positioning. Download datasheet SpotOn LA: Large aperture beam positioning system for applications exceeding 100 mm of beam positioning area. Download datasheet SpotOn USB 2.0: A portable, fast and accurate optical beam positioning system (down to 0.1 µm) featuring a USB 2.0 interface. Download datasheet Key Features: Complete Line of Laser Beam Positioning Various Detector Types: Lateral Effect, Centrally Perforated Four-quadrant, CCD Simultaneous Operation of Several Detectors Fast Acquisition up to 60 kHz Calibrated Lasers for Alignment Reference Applications: Machine Straightness Measurement; Alignment of Optical Systems; Vibration Measurement; Quality Control