Product information "OCDR-1000 Optical Coherence Domain Reflectometer"
1310, 1550 nm; Dynamic Range >80 dB; Scan Range 600 mm; Spatial Resolution 10-25 µm; RL Range 10-90 dB; Sweep Speed 20 mm/s
General Photonics’ OCDR-1000 is an optical coherence domain reflectometer designed to obtain space-resolved reflection information inside a fiber optical component, such as a photonic integrated circuit (PIC), for diagnosing quality or design issues. It is based on a polarization optimized white light interferometer proprietary to General Photonics.
The OCDR-1000 optical coherence domain reflectometer performs the functions of the discontinued Agilent 8504B Reflectometer – and more – but with better polarization management, spatial resolution and accuracy; larger scan range and dynamic range; and smaller size and weight.
The OCR-1000 is a low-cost alternative to OFDR technology, with a much higher dynamic range that avoids the masking of small reflection peaks by the large reflections typical of the input surface of an optical device.
The OCDR-1000 optical coherence domain reflectometer can measure devices with a length of up to 600 mm. A set of length-matching delay modules is available to match the pigtail lengths of the devices to be measured and place the measurement span in the region of interest. With a reflection dynamic range of over 80 dB and a spatial resolution down to 10 µm, this instrument helps engineers and researchers see the inside of an optical device to precisely identify defects and their locations.
Key Features:
- Dynamic Range: >80 dB
- Scan Range: 600 mm (400 mm in Fiber)
- Spatial Resolution: 10 to 25 μm
- Operating Wavelengths: 1310, 1550 nm, Others on Request
- Return Loss (RL) Range: 10 to 90 dB
- Sweep Speed: 20 mm/s
- Compact & Lightweight
- Built-in Light Source
- Average Light Source Power: >-3 dBm
- Performs Functions of Discontinued Agilent 8504B Reflectometer - and More
- Dimensions: 89 x 356 x 356 mm
Applications: Optical Characterization of Photonic Integrated Circuits, Fiber Optic Components; Accurate Measurement of Return Loss, Distributed Reflectivity