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T-Ray® Server Software for Terahertz Gauging & Imaging

Product information "T-Ray® Server Software for Terahertz Gauging & Imaging"

Modular SW Platform; Available Options T-Ray® Basic, T-Ray® T-Gauge, T-Ray® Imaging, SPG, T-Ray® Security, LSG; Client-server SW Architecture; XML Command Language; High-speed Data Analysis

Luna’s T-Ray® Server Software for the supplier’s T-Ray® 5000 compact pulsed terahertz measurement system is the most versatile terahertz waveform processing software available today. Built as a modular software platform, T-Ray® Server collects, analyzes, and serves terahertz waveforms and terahertz measurement data for a broad range of customer applications.

T-Ray® Server is a simple but flexible software environment structured in a server-client software architecture. It runs on a powerful single-board computer (SBC) embedded in the Terahertz Control Unit (TCU). This calculation engine collects and processes the terahertz waveforms to provide a broad range of measurements. These measurements can be accessed by using one of the T-Ray® Server Client programs, or by use of XML commands over one of the Ethernet ports of the SBC. This XML communication allows customers to write their own client programs that utilize the rich data available from the T-Ray® Server.

While T-Ray® Basic will allow configuration of the inputs and outputs of the TCU hardware and will stream THz waveforms at up to 1000 per second, the real power of T-Ray® Server is demonstrated when it is coupled with the various client programs available.

Key Features:

  • Available Options: T-Ray® Basic, T-Ray® T-Gauge, T-Ray® Imaging, SPG, T-Ray® Security, LSG (See Datasheet)
  • Designed for the Factory and the Researcher
  • Robust Database Structure to Ensure Continuity of Performance
  • Built on Embedded Operating System to Survive Power Failures
  • Client-server Architecture for Flexible Configuration
  • High-speed Data Analysis of Every Waveform
  • Powerful Script Interface for Flexible Waveform Analysis
  • XML Command Language for Integrating into Higher-level Control Systems
  • Reliable THz Measurements Based on 20 Years of THz Analysis Experience
  • Easy to Use Interface
  • Easy to Recall Analysis Recipes Stored in the System Database
  • Full Integration Support
  • Field-tested Software Platform
  • Local and Remote Access
  • Operational Security Through Multiple User Categories
Manufacturer "Luna"
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Accessories and Fixturing for Terahertz Gauging & Imaging
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iOSNRG-1000-TUN Benchtop Intelligent Optical Signal-to-Noise Ratio Generator
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LCA 500 Lightwave Component Analyzers
1270-1610 nm; Wavelength Resolution 1.6 pm; Loss Measurement Dynamic Range 60, 80 dB; Loss Measurement Resolution ±0.002, ±0.05 dB; Laser Sweep Rate 70 nm/s; Measurement Time 12, 55 s; Maximum Device Length 75, 150 m Luna’s LCA 500 lightwave component analyzers are fast and accurate systems that are ideal for production test and quality control. The LCA 500 series provides the high throughput and connectivity needed for the manufacturing floor while delivering the extremely high resolution and sensitivity that is critical when testing and validating modern photonic devices and network subsystems. The LCA 500 lightwave component analyzers provide single-scan measurements for testing a wide range of passive components from couplers to Optical Fibers and everything in between (Fiber Bragg Gratings, arrayed waveguide gratings, free-space filters, tunable devices, amplifiers, etc.). Key Features: Single Scan Measurement of Insertion Loss (IL), Return Loss (RL) and Polarization Dependent Loss (PDL) High Resolution: 1.6 pm High Sensitivity: 80 dB Dynamic Range Integrated Tunable Light Source – No External Tunable Laser Needed Measure in Transmission or Reflection Compatible With C and L Band (LCA 500) or O Band (LCA 513) Complete Full-band Measurement Scan in Less Than 3 s User-friendly Interface Wavelength Range: 1270 to 1610 nm Wavelength Resolution: 1.6 pm Loss Measurement Dynamic Range: 60, 80 dB Loss Measurement Resolution: ±0.002, ±0.05 dB Laser Sweep Rate: 70 nm/s, 1 Hz Measurement Time: 12, 55 s Maximum Device Length: 75 m (Reflection), 150 m (Transmission) Applications: Testing of Passive Components like DWDMs, AWGs, Filters, Switches, Waveguide Gratings, Modulators, Couplers, etc.; High-resolution Measurements for Planar Light Circuits (PLCs) and Silicon Photonic Devices; Manufacturing Test and Quality Control; Flexible Tunable Laser Source splitters
Product number: SW11260
Manufacturer:
LDA-100 Laser Diode Analyzer
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Manufacturer:
Luna 6415 Lightwave Component Analyzer
OFDR Technology; Spatial Resolution 20 µm; Max. Device Length 20, 40 m; Center Wavelength 1546.69 nm; Wavelength Range 40 nm; Dynamic Range 15, 70 dB The Luna 6415 lightwave component analyzer is a fast and simple-to-use analyzer for passive optical components and modules, extending Luna’s industry-leading optical frequency domain reflectometry (OFDR) platform to manufacturing test and quality control applications. Unlike traditional passive component testers, Luna 6415 measures and analyzes the insertion loss (IL) and return loss (RL) distribution as well as length with a single instrument, working in either reflection or transmission. The Luna 6415 lightwave component analyzer utilizes optical frequency domain reflectometry (OFDR) technology to measure backscattered or transmitted light as a function of distance. The system features extremely high sensitivity, 20 μm spatial sampling resolution and very fast scanning for high test throughput, making it an ideal testing tool for photonic integrated circuits (PICs) and silicon photonics. By integrating both reflection and transmission measurements, Luna 6415 reduces the cost and complexity of test while increasing throughput and provides more complete test coverage of your component. The Luna 6415 lightwave component analyzer further simplifies your manufacturing test with an integrated tunable laser source , automated IL and RL calculations, self-calibration and very high scanning speeds for greater test throughput. Key Features: Return Loss (RL) and Insertion Loss (IL) Analysis Trace Distributed Return Loss (RL) Over Length of Optical Path – Easily Measure Waveguide Scattering Spectral Analysis of Return Loss (RL) and Insertion Loss (IL) Detect and Precisely Locate Reflective Events and Measure Path Length Speed, Resolution and Accuracy for Optimizing Production Test High Spatial Sampling Resolution: 20 μm Measurement Range: 20 m Scan/Acquisition Rate: 6 Hz Maximum Device Length: 20 m (Reflection), 40 m (Transmission) Wavelength Range: 40 nm Center Wavelength: 1546.69 nm Maximum Optical Power: 5 mW Dynamic Range: 70 dB (RL Measurement), 15, 70 dB (IL Measurement, Reflection / Transmission Mode) Return Loss Measurement Sensitivity: -135 dB Measurement Resolution: ±0.1 dB Applications: Spatial RL Testing; Automated Insertion Loss (IL) Test and Analysis; Skew Measurement With Sub-picosecond Resolution; PLCs, Waveguide Devices, AWGs, ROADMs, etc.; Couplers, Switches, Beamsplitters
Product number: SW11258
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