T-Gauge® Sensors & Gauges for Terahertz Gauging & Imaging

Product number: SW11933

Downloads

T-Gauge HXC50yn Online Sensor Head for Terahertz Gauging and Imaging Luna Datasheet.pdf
T-Ray 5000 LSG500n Line Scan Gauge for Terahertz Gauging and Imaging Luna Datasheet.pdf
T-Ray 5000 SPG500n Single Point Gauge for Terahertz Gauging and Imaging Luna Datasheet.pdf
T-Gauge HXP51y2 Online EPG Sensor Head for Terahertz Gauging and Imaging Luna Datasheet.pdf
T-Gauge HSC50yn Compact Industrial Sensor for Terahertz Gauging and Imaging Luna Datasheet.pdf
T-Gauge HXC51yn Online Sensor Head with VRS for Terahertz Gauging and Imaging Luna Datasheet.pdf
T-Gauge SCS500n Online Sensor Solution CID1 for Terahertz Gauging and Imaging Luna Datasheet.pdf

Product information "T-Gauge® Sensors & Gauges for Terahertz Gauging & Imaging"

Horizontal PER <20:1; Beam Diameter 20, 38, 40 mm; Lens 25,75,150 mm, Collimating; Min. Layer Thickness 10-50 µm; Single High-flex Umbilical

Luna’s T-Ray® 5000 measurement system is one of the fastest terahertz systems available on the market. Luna’s broad range of T-Gauge® sensor heads and gauges are paired with the T-Ray® 5000 Intelligent Terahertz Control Unit to create a complete system.

Transmitter and receiver are securely mounted inside the online sensor head’s sealed metal housing. The umbilical for the transceiver, containing the electrical and optical connections, is constructed with high flex rated electrical cable to allow for continuous scanning. When connected to a T-Ray® 5000 Control Unit, the online sensor heads will provide excellent waveform response, capable of providing detailed reflection measurement of layered surfaces or products.

The T-Gauge® HXC50yn is a high-performance online sensor head with full transceiver functionality and takes the robustness of the T-Ray® 5000 terahertz system to a new level with the ability to operate in industrial environments. Reflection measurement of thickness, multi-layer thickness, and basis weight are easily acquired. A variety of lenses are available to adjust the measurement spot size and working distance.

The “y” and “n” in the model number correspond to the focal length of the lens, and the type of terahertz transmitter, respectively – “y” = 4 for 75 mm lens and 5 for 150mm lens, “n” = 1 for a type 1 transmitter and 2 for a type 2 transmitter.

The T-Gauge® HXC51yn online sensor head adds functionality to the standard online sensor head with a virtual reference surface (VRS). Reflection measurement of thickness, multi-layer thickness, basis weight, and density are easily acquired. The VRS enables non-contact, calibration-less caliper thickness measurement as well as basis weight and density without reducing the open separation between the sensor and the product.

The T-Gauge® HXP51y2 online EPG sensor head allows measurement of thinner layers than the standard HXC50yn online sensor head. With higher bandwidth and higher signal to noise, the EPG opens new applications to terahertz process control. Coatings on metal or composite substrates and free standing films can be measured down to 10 µm (0.5 mil).

The T-Gauge® HSC50yn compact industrial sensor is designed for industrial applications that require a smaller footprint, a lighter weight or two output beams. These capabilities are met by the HSC50yn, which capitalizes on the new single fiber lighter weight umbilical, and a more compact design, to allow robot mounting. With proper attention to the configuration, it can be used to inspect two points on the same object. In the case of small diameter tubing, this can even be used to measure four orthogonal points at the same time.

The T-Gauge® SCS500n explosion-proof thickness measurement system takes the robustness of the T-Ray® 5000 to a new level with the ability to operate in flammable atmospheres, such as paint booths or coating facilities. Designed to be robot mountable and intrinsically safe, the T-Gauge® SCS500n Online Sensor Solution CID1 SCS500n is optimized for use in spray booth applications but can be used in other applications as well. The working distance of the sensor head is fixed at 115 mm, but other working distances may be available upon request.

The T-Ray® 5000 LSG500n line scan gauge (LSG) provides a handheld solution for high-speed scanning of a line 50 mm or 75mm in length. The line scan image is displayed on the screen of the handheld tool and can be analyzed by dedicated software for specific applications. Current software solutions can provide layer thickness measurements, detection of voids, or alignment of body panels with measurement of the vertical and horizontal offset between them.

The T-Ray® 5000 SPG500n single point thickness measurement gauge allows direct measurement of multiple layer objects with the press of a button. The modular nature of the measurement tool allows either straight-on or right-angle measurement tips. By using pulse time-of-flight (ToF) to make its measurements, the SPG500n has greater insensitivity to environmental and material variations that can lead to calibration inaccuracies, as well as operator inconsistencies. The measurement is fundamentally non-contact, but for hand-held use, a measurement tip is used to aid the user in positioning the object at the focus of the THz beam.

Key Features:

Full Transceiver Functionality, No Need for Separate Transmitter and Receiver
Collinear Design
Two Measurement Ports With Potential to Use Both Ports at Once (HSC50yn)
Cost-effective Plastic Lens
TPX Lens for Low Loss (HXP51y2)
Solvent Resistant Lens (SCS500n)
Hardened Case for Industrial Environment, Tolerant to Dirt and Dust in the Factory
Capable of Being Cleaned
Safe in Explosive Environments (SCS500n)
Single High-flex Umbilical, Long Umbilical Life in Scanner or Robot
Simple Orientation to Target
Variety of Focal Lengths Available: 25 mm (not All Models), 75 mm, 150 mm, Collimating Lens
Polarization Extinction Ratio (PER): >20:1, Horizontal
Beam Diameter: 38 mm (HXC51yn), 40 mm (HXC50yn, HSC50yn), 20 mm (HXP51y2)
Sweep Rate: ≤8/s (LSG500n)
Pointing Lasers to Guide Tool Alignment (LSG500n)
Gauge Direction: 0°, 90° (SPG500n)
Min. Layer Thickness: 50 µm (LSG500n), 10 µm (HXP51y2, Single Layer),
25 µm (HXP51y2, Buried Layer)
Passline Tolerance: ±2 mm (HXP51y2, 150 mm Lens)
Inexpensive to Replace if Damaged
Extended Lifetime
Replace Multiple Sensors
Supports VRS Functionality (HXC51yn)
Compatible With Various Motion Options
Improve Product Quality by Optimizing Production
Increases Product Gap for Density Measurements
Operating Temperature Range: 0°C to +50°C
Mounting Hardware: ¼-20 Threaded Mounting Holes
Dimensions: 250 x 150 x 150 mm (LSG500n), 128 x 66 x 178 mm (HXC50yn, HXC51yn), 128 x 66 x 178 mm (HXP51y2), 76 x 67 x 152 mm (HSC50yn), 64 x 76 x 267 mm (SPG500n)
Weight: 1.6 kg (HXC50yn, HXP51y2), 1.8 kg (HXC51yn), 1.1 kg (HSC50yn), 1 kg (LSG500n); 2 kg (SPG500n)

Applications: Measure Layer Thickness; Produce Scanned Images; Industrial Process Control like Commercial Roofing, Foam Density, Adhesive Foams, Paint or Coating Thickness, Plastic Extrusion, Asphalt Shingles; Nondestructive Materials Inspection Applications like Aircraft Coatings, Packaged Goods, Radomes, Spacecraft, Pipeline Repairs, Void Detection, Subsurface Defects or Inclusions, Art Conservation; Converting Applications like Paper Coating, Multilayer Films, Tires; Terahertz Line Scan Imaging

Manufacturer "Luna"

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Manufacturer:

LCA 500 Lightwave Component Analyzers

1270-1610 nm; Wavelength Resolution 1.6 pm; Loss Measurement Dynamic Range 60, 80 dB; Loss Measurement Resolution ±0.002, ±0.05 dB; Laser Sweep Rate 70 nm/s; Measurement Time 12, 55 s; Maximum Device Length 75, 150 m Luna’s LCA 500 lightwave component analyzers are fast and accurate systems that are ideal for production test and quality control. The LCA 500 series provides the high throughput and connectivity needed for the manufacturing floor while delivering the extremely high resolution and sensitivity that is critical when testing and validating modern photonic devices and network subsystems. The LCA 500 lightwave component analyzers provide single-scan measurements for testing a wide range of passive components from couplers to Optical Fibers and everything in between (Fiber Bragg Gratings, arrayed waveguide gratings, free-space filters, tunable devices, amplifiers, etc.). Key Features: Single Scan Measurement of Insertion Loss (IL), Return Loss (RL) and Polarization Dependent Loss (PDL) High Resolution: 1.6 pm High Sensitivity: 80 dB Dynamic Range Integrated Tunable Light Source – No External Tunable Laser Needed Measure in Transmission or Reflection Compatible With C and L Band (LCA 500) or O Band (LCA 513) Complete Full-band Measurement Scan in Less Than 3 s User-friendly Interface Wavelength Range: 1270 to 1610 nm Wavelength Resolution: 1.6 pm Loss Measurement Dynamic Range: 60, 80 dB Loss Measurement Resolution: ±0.002, ±0.05 dB Laser Sweep Rate: 70 nm/s, 1 Hz Measurement Time: 12, 55 s Maximum Device Length: 75 m (Reflection), 150 m (Transmission) Applications: Testing of Passive Components like DWDMs, AWGs, Filters, Switches, Waveguide Gratings, Modulators, Couplers, etc.; High-resolution Measurements for Planar Light Circuits (PLCs) and Silicon Photonic Devices; Manufacturing Test and Quality Control; Flexible Tunable Laser Source splitters

Product number: SW11260

Manufacturer:

LDA-100 Laser Diode Analyzer

Laser Diode Current 0-500 mA; LD Compliance Voltage 0.0-8.0 V; TEC Current 0-1 A; TEC Voltage Range ±8.00 V; Photodiode Current 0-3600 μA; Setpoint Resolution 0.1 mA; Setpoint Accuracy ±0.05% OZ Optics’ LDA-100 low cost, compact and standalone laser diode analyzer provides quick and versatile laser diode characterization and parametric analysis. The unit features a high-resolution LIV (light, current, voltage) measurement system, providing all main laser diode parameters including threshold current and slope efficiency. The setup and measurement takes only a few seconds. The measured parameters are displayed on a color touch screen, and the data can be downloaded to any host computer for further processing and analysis through a built-in USB interface. The unit features a built-in smart driver that will automatically detect the laser diode pinout. The user can select to operate the laser diode under test in either auto-current or auto-power control modes. The integrated TEC controller maintains your diode at its operating temperature, ensuring accurate and repeatable measurements. The smart laser diode analyzer comes with multiple features for safe and accurate measurements. These features include current limit protection, automatic pinout detection, sensor range checks and manager passcode level to prevent any accidental changes of the preset settings that could otherwise harm the laser diode under test, or invalidate the results. External interlocks can be connected to disable the laser diode in response to safety concern situations. Each unit is provided as a set that includes all required accessories for direct plug-and-play operation. The kit includes a calibrated optical power meter head and a thermally controlled laser diode holder for 5.6 mm package laser diodes (holders for 3.8 mm and 9 mm packages are offered separately). A simple sliding mechanism allows easy laser diode replacement. Special laser diode adapters can be customized upon request for any laser diode package. Key Features: Integrated Temperature Controller Compact Plug-and-Play Laser Diode Analyzer Fast and Accurate LIV (Light, Current, Voltage) Curve Generation With 0.1 mA Resolution Setpoint Resolution: 0.1 mA Setpoint Accuracy: ±0.05% Laser Diode Compliance Voltage: 0.0 V to 8.0 V Laser Diode Drive Current up to 500 mA Photodiode Current Range: 0 μA to 3600 μA Photodiode Current Resolution: 0.1 μA 15-bit Power Resolution 3 W Output TEC Temperature Controller Max. TEC Current: 1 A TEC Voltage Range: ±8.00 V Temperature Control Range: +10°C to +50°C Password Protection, Hardware Interlock and Overcurrent Shut-off Circuitry for Safety Built-in Smart Driver for Diode Pinout Auto Detection and Temperature Control Touchscreen Control and Accompanying Windows Software Operating Rel. Humidity: <85%, Non-condensing Dimensions Analyzer: 110 x 63 x 30 mm Dimensions Analyzer + Accessories: 110 x 115 x 45 mm Weight Analyzer: 300 g Weight Analyzer + Accessories: 1000 g Applications: Laser Diode Characterization; Laser Diode Quality Control; Laser Source Calibration

Product number: SW11748

Manufacturer:

Luna 6415 Lightwave Component Analyzer

OFDR Technology; Spatial Resolution 20 µm; Max. Device Length 20, 40 m; Center Wavelength 1546.69 nm; Wavelength Range 40 nm; Dynamic Range 15, 70 dB The Luna 6415 lightwave component analyzer is a fast and simple-to-use analyzer for passive optical components and modules, extending Luna’s industry-leading optical frequency domain reflectometry (OFDR) platform to manufacturing test and quality control applications. Unlike traditional passive component testers, Luna 6415 measures and analyzes the insertion loss (IL) and return loss (RL) distribution as well as length with a single instrument, working in either reflection or transmission. The Luna 6415 lightwave component analyzer utilizes optical frequency domain reflectometry (OFDR) technology to measure backscattered or transmitted light as a function of distance. The system features extremely high sensitivity, 20 μm spatial sampling resolution and very fast scanning for high test throughput, making it an ideal testing tool for photonic integrated circuits (PICs) and silicon photonics. By integrating both reflection and transmission measurements, Luna 6415 reduces the cost and complexity of test while increasing throughput and provides more complete test coverage of your component. The Luna 6415 lightwave component analyzer further simplifies your manufacturing test with an integrated tunable laser source , automated IL and RL calculations, self-calibration and very high scanning speeds for greater test throughput. Key Features: Return Loss (RL) and Insertion Loss (IL) Analysis Trace Distributed Return Loss (RL) Over Length of Optical Path – Easily Measure Waveguide Scattering Spectral Analysis of Return Loss (RL) and Insertion Loss (IL) Detect and Precisely Locate Reflective Events and Measure Path Length Speed, Resolution and Accuracy for Optimizing Production Test High Spatial Sampling Resolution: 20 μm Measurement Range: 20 m Scan/Acquisition Rate: 6 Hz Maximum Device Length: 20 m (Reflection), 40 m (Transmission) Wavelength Range: 40 nm Center Wavelength: 1546.69 nm Maximum Optical Power: 5 mW Dynamic Range: 70 dB (RL Measurement), 15, 70 dB (IL Measurement, Reflection / Transmission Mode) Return Loss Measurement Sensitivity: -135 dB Measurement Resolution: ±0.1 dB Applications: Spatial RL Testing; Automated Insertion Loss (IL) Test and Analysis; Skew Measurement With Sub-picosecond Resolution; PLCs, Waveguide Devices, AWGs, ROADMs, etc.; Couplers, Switches, Beamsplitters

Product number: SW11258

Manufacturer: