OBR 6200 Optical Backscatter Reflectometers

Product number: SW11257

Manufacturer: Luna

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Product information "OBR 6200 Optical Backscatter Reflectometers"

Portable & Rugged; 1270-1610 nm; Resolution 80-200 µm; Measurement Time 10 s; Measurement Length Modes 10,50,100 m; Dynamic Range 15 (IL), 70 (RL) dB; RL Measurement Sensitivity -129 dB

Luna’s OBR 6200 series of optical backscatter reflectometers are portable and rugged ultra-high resolution reflectometers with backscatter-level sensitivity for testing short networks deployed in aerospace, naval, data center and industrial applications.

Troubleshoot fiber assemblies in the field to easily locate optical loss events with sub-millimeter resolution. Learn more about highest-resolution OTDR measurements available in the downloadable data sheet.

The OBR 6200 series utilizes optical frequency domain reflectometry (OFDR) technology to measure distributed return loss (RL) and insertion loss (IL) with high precision and dynamic range. The systems easily locate optical loss events with sub-millimeter spatial resolution.

OBR 6200 optical backscatter reflectometers are rugged battery-powered integrated systems with an intuitive touchscreen user interface, making them ideal for field maintenance applications. The user interface includes screen modes for interactive RL and IL measurement as well as automatic event detection.

Key Features:

Fully Portable and Rugged Optical Backscatter Reflectometers
Track and Analyze Return Loss (RL) and Insertion Loss (IL) Versus Length
Spatial Sampling Resolution: Down to 80 μm
Detect and Precisely Locate Reflective Events
Measure Optical Path Length With High Precision
Automatic Event Detection
One or Two Optical Channels
Available With IP65 and MIL-STD Certifications
Measurement Length Modes: 10, 50, 100 m
Sampling Resolution: 80 to 200 µm
Length Measurement Accuracy: <1 to <4 mm
Wavelength Scan Range: 4 to 10 nm
Center Wavelength: 1546.7 nm
Measurement Time: 10 s
Dynamic Range: 70 dB (RL Measurement), 15 dB (IL Measurement)
Return Loss Measurement Sensitivity: -129 dB
Measurement Resolution: ±0.1 dB

Applications: Troubleshoot Fiber Assemblies in the Field; Precisely Locate Insertion Loss (IL) Sites, High-RL (Return Loss) Connections, Fiber Breaks, etc.; Maintain Avionics, Aerospace, Naval and Industrial Networks; Verify Fiber Lengths of Data Center Interconnects; Troubleshoot Fiber Optic Sensing Systems

Manufacturer "Luna"

Headquartered in Roanoke, VA, USA, Luna develops, manufactures and markets high-definition fiber optic sensing products and fiber optic test and measurement instrumentation . Luna's products are used to measure, monitor, protect and improve critical processes in the healthcare, telecommunications, energy and defense markets. Luna has become a recognized leader in transitioning science to solutions. Luna’s high-definition fiber optic sensing technology allows engineers to test, modify and qualify their designs; efficiently, effectively, and accurately. The HYPERION series of fiber optic sensing interrogators provide many of the advantages of fiber optic systems and distinguishes itself by virtue of high spatial resolution. On the test and measurement side, Luna provides diagnostic and test instrumentation that enables the complete characterization of optical components, assemblies and short-haul networks; providing substantial cost and time savings in the development, production, and maintenance of optical network equipment. Optical backscatter reflectometers (OBR series) enable ultra-high resolution reflectometry with backscatter level sensitivity, while lightwave component and optical vector analyzers extend Luna’s industry-leading optical frequency domain reflectometry (OFDR) platform to manufacturing test and quality control applications for passive optical components.

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OBR 4600 Optical Backscatter Reflectometers

Zero Dead Zone; 1270-1610 nm; Resolution 10-250 µm; Scan Time 0.4-16 s; Max. Device Length 30-2,000 m; Dynamic Range 60, 80 dB; Backscatter-level Sensitivity -130 dB OBR 4600 optical backscatter reflectometers are part of Luna’s award-winning OBR Optical Backscatter Reflectometer product line. Designed for component testing, short run network testing and troubleshooting, the OBR 4600 reflectometers enable ultra-high resolution reflectometry with backscatter level sensitivity. The OBR 4600 reflectometers feature spatial resolution as fine as 10 µm, no dead zone and an extremely low noise floor. The OBR 4600 comes with an extensive range of options including a strain and temperature sensing package with maximum sensor lengths up to 2 km. To increase the functionality of their OBR 4600 optical backscatter reflectometer, users can add the following options: Spot Scan Option: Allows the user to narrow the scan range to 1 to 2 m area within the network under test. This reduces the time required to scan and also allows the user to focus exclusively on the area of interest. Hard Shell Carrying Case Option: The OBR 4600 can be provided with a hard shell carrying case for applications that require portability or exposure to more rugged environments. 2 km Sensing Length Option: The OBR 4600 range can be extended up to 2 km with a 3 mm spatial resolution and no dead zone. Software Development Kit Option: A selection of DLL files can be provided to allow users to customize their own test equipment user interface with the OBR 4600 operation. Lightpath Analysis Software Option: Allows the user to program a go/no go check based on a pre-selected characterization of a component or network. This option is ideal for testing and can reduce a complicated analysis to a simple pass/fail end of line production test. Distributed Temperature and Strain Sensing Package: This option allows the user to make strain or temperature measurements using sensors made with standard unaltered fiber optic cable that does not require fiber bragg gratings. The distributed sensing option can provide sub-cm spatial resolution with sensors up to 2 km. Key Features: “Zero Dead Zone” Reflectometers Measure Insertion Loss (IL), Return Loss (RL), Distributed Loss, Distance, Polarization States, Phase Derivative and Group Delay Easily Locate, Identify and Troubleshoot Macro-bends, Splices, Connectors and Breaks Dual Display With Intuitive User Interface Allows to Simultaneously Determine Fault Location and Fault Magnitude and Perform Fault or Component Characterization Highlight Selected Sections of the Scan and Perform an Analysis in the Frequency Domain User-selectable Scanning Wavelength Range and Centerpoint Fast Scanning: Measure 30 m with 10 μm Sampling Resolution in <7 s Continuous High-speed Scanning: 1 m Segments at up to 3 Hz Optional Spot Scanning Feature Extended Range Option Provides 2 km Range With no Dead Zone Wavelength Range: 1270 to 1610 nm Maximum Wavelength Resolution: 0.02 pm Maximum Device Length: 30 to 2,000 m Sampling Resolution: 10 to 250 µm Scan Time: 0.4 to 16 s Measurement Rate in Spot Scan Mode: 0.15 to 3.7 Hz Dynamic Range: 60, 80 dB Backscatter-level Sensitivity: -130 dB High-resolution C and L Band (OBR 4600) or O Band (OBR 4613) Capability Applications: Easily Locate, Identify and Troubleshoot Macro-bends, Splices, Connectors and Breaks; Locate Insertion Loss (IL) Points at Every Point in the Network or Assembly – Eliminate Cutbacks; Test and Troubleshoot Short-run Networks (up to 2 km); Unprecedented Visibility into Miniaturized Components

Product number: SW11256

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