LWA 7601-C Lightwave Analyzer C Band
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Product information "LWA 7601-C Lightwave Analyzer C Band"
The LWA 7601-C Lightwave Analyzer C Band from Luna is a high-performance optical test and measurement instrument designed for the characterization of modern optical components, photonic integrated circuits (PICs), silicon photonics devices, and fiber optic networks. Utilizing advanced Optical Frequency Domain Reflectometry (OFDR) technology, the LWA 7601-C measures backscattered and transmitted light as a function of distance, time, or wavelength, delivering unparalleled insight into optical performance.
Engineers and manufacturers face increasing demands for accuracy, speed, and efficiency when testing optical devices. The LWA 7601-C addresses these challenges by combining return loss (RL), insertion loss (IL), and length measurements within a single instrument, significantly reducing test complexity while improving throughput. Its exceptional sensitivity and 20 μm sampling resolution make it particularly valuable for applications where precise fault location and detailed optical analysis are critical.
Whether deployed in research laboratories, production environments, or network validation applications, the LWA 7601-C provides a comprehensive solution for analyzing optical components in both reflection and transmission modes. With a measurement range of up to 500 meters for path length analysis and high-speed acquisition rates of up to 12 Hz, users can quickly identify issues, optimize device performance, and streamline testing workflows.
Key features
- The LWA 7601-C offers a powerful feature set that enables accurate and efficient testing of optical components and assemblies.
- Return Loss (RL) and Insertion Loss (IL) Analysis
- Simultaneously evaluate critical optical performance parameters to gain a complete understanding of component quality and behavior.
- Reflection and Transmission Measurements
- Analyze optical devices in both reflection and transmission modes with a single instrument, eliminating the need for multiple test systems.
- Distributed RL Measurement
- Trace return loss along the entire optical path, making it possible to identify reflections and losses at specific locations within a device or network.
- Spectral Analysis Capabilities
- Perform detailed spectral analysis of insertion loss and return loss characteristics to better understand wavelength-dependent performance.
- Precise Event Location and Length Measurement
- Detect, isolate, and accurately locate reflective events while measuring optical path length up to 500 meters, supporting rapid troubleshooting and validation.
- High Resolution and Sensitivity
- A sampling resolution of 20 μm enables detailed analysis of optical structures and facilitates the detection of even minor performance variations.
- Fast Acquisition Speed
- With a measurement rate of up to 12 Hz, the analyzer supports high-throughput testing and production optimization.
- Production-Ready Design
- An optional 19-inch rack-mount version allows seamless integration into automated test benches and manufacturing environments.
These capabilities help organizations reduce testing costs, improve repeatability, and increase productivity across research, development, and manufacturing operations.
Applications
The LWA 7601-C is designed to support a broad range of optical testing applications across telecommunications, datacom, silicon photonics, and advanced photonics manufacturing.
Spatial Return Loss Testing
The instrument makes it possible to identify and quantify reflections throughout an optical path, allowing engineers to locate defects, connector issues, and component mismatches with exceptional precision.
Automated Insertion Loss Analysis
Manufacturers can automate insertion loss measurements and analysis processes, improving consistency while reducing manual testing effort and overall production time.
High-Precision Skew Measurements
The LWA 7601-C supports skew measurements with sub-picosecond resolution, making it an excellent choice for applications requiring precise timing and path matching.
Photonic Integrated Circuit Testing
The analyzer is ideally suited for testing advanced photonic devices, including:
- Photonic Integrated Circuits (PICs)
- Waveguide devices
- Planar Lightwave Circuits (PLCs)
- Arrayed Waveguide Gratings (AWGs)
- Reconfigurable Optical Add-Drop Multiplexers (ROADMs)
Its high resolution enables detailed characterization of complex photonic structures and integrated optical systems.
Fiber Optic Networks and Cables
The extended measurement range and distributed analysis capabilities make the instrument highly effective for validating fiber networks, cable assemblies, and optical links. Users can rapidly identify losses, reflections, and length-related issues throughout the system.
Optical Components and Subassemblies
The LWA 7601-C is also widely used for testing passive optical components such as filters, couplers, switches, beam splitters, fiber Bragg gratings (FBGs), and specialty fiber assemblies, ensuring they meet performance specifications before deployment.
What’s next?
As photonic technologies continue to advance, the need for faster, more accurate, and more comprehensive optical testing solutions becomes increasingly important. The LWA 7601-C Lightwave Analyzer C Band provides the precision, speed, and versatility required to support next-generation optical component development and production. By combining return loss, insertion loss, spectral analysis, and length measurement capabilities into a single platform, it simplifies testing workflows while delivering highly accurate results.
Whether you are developing cutting-edge photonic integrated circuits, optimizing manufacturing processes, or troubleshooting complex fiber optic networks, the LWA 7601-C offers a reliable and scalable solution for achieving superior optical performance. With its advanced OFDR technology, high-resolution measurements, and production-ready design, it is an investment that can help accelerate innovation while maintaining the highest standards of quality and efficiency.
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Output Current LD 2, 5 A; Output Current TEC 5, 10 A; Benchtop or Rack Mount; Compatible with Type A, B & C Lasers Wavelength Electronics’ LDTC LAB series of instrument type laser diode and TEC temperature controllers combine best-in-class low noise, high-end digital control laser diode driver technology with an IntelliTune® smart TEC temperature controller. If you need stable wavelength, stable temperature (better than 0.0009 °C with thermistors), stable laser diode current or power, or low noise (RMS laser driver noise as low as 7 µA), these offer the best performance and value. Two models are available, the LD2TC5 LAB and the LD5TC10 LAB. The LD2TC5 LAB outputs up to 2 and 5 A for the laser and thermoelectric, respectively. The LD5TC10 LAB outputs up to 5 and 10 A. Both models offer 10 V of laser compliance voltage and 15 V of thermoelectric compliance voltage. The touch-screen interface makes operation intuitive and simple. A LabVIEW® virtual instrument, remote command set, and USB interface allow integration into an instrument library. Operation in Constant Current (CC) or Constant Power (CP) mode changes with the touch of a button. A wide variety of sensors work in the temperature control feedback loop. Safety features protect the thermoelectric cooler (TEC) and the laser. Over- and under-temperature limits on the load, positive and negative (where applicable) current limits, and voltage limits can be set for both TEC and laser. If the sensor signal is lost or a short is detected at the TEC, output current is disabled. Passive and active interlocks are available for safety of equipment and user. Automatic laser shutdown upon TEC error is also available. You can link laser diode current to safe and stable thermoelectric operation. With Wavelength Electronics’ plug and play instrument, you have the ability to quickly set the controls using either the instrument touch screen or a remote computer, and results are easy to monitor. Wavelength Electronics’ proprietary IntelliTune® algorithm characterizes the TEC/sensor system’s response to the controller and determines the optimal PID control coefficients. It then automatically adjusts the PID control values as setpoint, tuning mode, or bias current change. Run IntelliTune® easily just off ambient and watch it change PID settings for a much higher or lower setpoint. After a single scan, explore either optimized Setpoint Response or Disturbance Rejection performance with your load to see which works best. Add or remove the D term to see if noise is an issue.IntelliTune® lets you skip the manual characterization and it’s smart enough to really work—very little adjustment is needed after you have stored a successful characterization scan. See Application Note IntelliTune® vs. Conventional Autotune for an in-depth exploration. An Interlock Kit containing a BNC terminator for the laser interlock and a pre-soldered DSUB to satisfy the laser interlocks is included with the instrument. Loose connectors for custom cable configuration are shipped with the unit. Full cables for both the laser connection and the thermoelectric connection are available. The LDMOUNT-5A, a 14-pin butterfly laser diode mount with integrated heat sinking, is available for simple connections between the LDTC LAB driver and the laser. Free, effective and responsive technical support is available to simplify integration of Wavelength products into your OEM design. Standard products can be easily modified to meet your application requirements. Get in touch with the AMS Technologies laser diode driver experts to discuss your customized solution! Key Features: Instrument Type, Benchtop Size: 98 x 224 x 450 mm Laser Cumulative Current Noise of 16 µA RMS Up to 5 A LD Current- Up to ±10 A TEC Current Supply Range: 100 to 240 VAC (±10%), 3 A, 50-60 Hz Compliance Voltage 10 V Laser & 15 V TEC Modulation Bandwidth: 450 kHz (CC Mode) Compatible With Most Sensor Types and all LD/PD Combinations Sensors Supported: Thermistors, 2-wire RTDs, Linear Current, Linear Voltage Temperature Coefficient: 25 ppm/°C- Temperature Stability Better Than 0.0009°C Modulation Input Bandwidth of 450 kHz (CC Mode) Intuitive User Interface Touchscreen Adjustable Current Limits, Over- and Under-temperature Protection IntelliTune® PID Temperature Control Remote Interface: USB Rise/Fall Time: 800 ns (to Full Scale, CC Mode) Applications: Medical Systems & Medical Diagnostic Equipment; Defence; Communications; Manufacturing Test; Particle and Droplet Measurement; Electro-optical Systems; Airborne Instrumentation; Spectroscopic Monitors
REQUEST PRICING AND AVAILABILITY
- Get your individual quote.
- Technical compatibility review included.
- Volume discounts available.
No obligation. Direct access to our engineering team.