WDM SM WDMs

Active Area Diameter 0.8-3 mm; Responsivity 25-36 A/W; Capacitance 2-10 pF; NEP 14-20 fW/√Hz; Dark Current 50, 100 nA; Package TO-5, TO-8Excelitas’ 1064 nm long-wavelength enhanced Silicon Avalanche Photodiodes (APDs) C30954EH, C30955EH and C30956EH are made using a double-diffused “reach-through” structure. The design of these photodiodes is such that their long-wave response (i.e. >900 nm) has been enhanced without introducing any undesirable properties.The C30954EH, C30955EH and C30956EH long-wavelength enhanced APDs have quantum efficiency of up to 40 % at 1060 nm. At the same time, the diodes retain the low-noise, low-capacitance, and fast rise and fall times characteristics.To help simplify many design needs, these APDs are also available in Excelitas’ high-performance hybrid preamplifier module type C30659 series, as well as the preamplifier and TE cooler incorporated module type LLAM series. In addition, these APDs are also available with built-in thermo-electric cooler for easier temperature control.The C30954EH long-wavelength enhanced silicon avalanche photodiode (Si APD) provides a 0.8 mm active area diameter in a TO-5 package.The C30955EH long-wavelength enhanced silicon avalanche photodiode (Si APD) provides a 1.5 mm active area diameter in a TO-5 package.The C30956EH large-area, long-wavelength enhanced silicon avalanche Photodiode (Si APD) provides a 3 mm active area diameter in a TO-8 package.Key Features:Active Area Diameter: 0.8, 1.5, 3 mmHigh Quantum Efficiency at 1060 nm: ≤40%Enhanced Long-wave Response: >900 nmFast Response Time: 2 nsWide Operating Temperature RangeLow Capacitance @100 kHz: 2 to 10 pFResponsivity @1060 nm: 25 to 36 A/WDark Current: 50, 100 nASpectral Noise Current: 0.5 pA/√HzNEP @1060 nm: 14 to 20 fW/√HzVop Range: 275 to 425 VHermetically Sealed Packages: TO-5, TO-8RoHS CompliantTEC Option AvailableCustomization Available Upon RequestApplications: Range Finding; LiDAR (Light Detection and Ranging); YAG Laser DetectionPlease note that Excelitas products are available from us only in Denmark, Finland, Iceland, Norway, and Sweden. 

Detector Type Si, IR-Enhanced Si, InGaAs, UV-Enhanced InGaAs, CMOS; 190-2700 nm; Beam Size 0.5-45,000 µm; Power Range 100 µW - 8 kW; Interface USB, USB 2.0, Other Duma Optronics offers a comprehensive series of beam analyzers based on technologies such as scanning knife-edge with tomographic beam reconstruction. The series’ wide spectral range is unprecedented for a single detector, ranging from 200 to 1600 nm and even further on to 2700 nm. High-power beam analyzers are available for testing high-power laser beams used for material processing. These HP models allow online measuring of beam profile and absolute power, measurement of M² and accurate location of beam waist for laser printing technology. Duma Optronics’ series of beam analyzers is capable of analyzing beam sizes from under 0.5 µm up to 45 mm and feature a full set of attachments for M² measurement and other sophisticated applications. BeamOn 2 MP: Best cost-effective system for high-resolution laser beam measurement, especially for focused beams. Key Features are 2 Megapixel resolution, 3 µm per pixel and down to 60 µm beam size. Download datasheetBeamOn WSR: This beam analyzer is based on a proprietary technology measuring from UV to 1550 nm with camera technology. For BeamOn WSR, a complete set of accessories is available, including a built-in motorized filter wheel. Download datasheetBeamOn LA: A beam diagnostics measurement system for real-time measurement of continuous or pulsed large laser beams (up to 45 mm). Download datasheetµBeam: The analyzer for microscopic beams: A beam diagnostics measurement system for real-time measurement and display of small CW or pulsed lasers in the sub-micron range, fiber optic and laser diode beam profiles. Download datasheetBeamOn U3-E: This 2.35 Megapixel wide spectral range detector is capable of measuring beams up to 1350 nm with a full setup of accessories for various applications. A version for ultraviolet (UV) wavelengths is available on request. Download datasheetLAM Beam Analyzer: New instrument especially designed for LAM (Laser Additive Manufacturing). Measuring critical parameters such as beam size, accurate beam position and power. Download datasheetBeam Analyzer HP: High-power measurements up to 5 kW based on beam sampler technology combined with pressurized air cooling will measure beam profile in real time and relative power fluctuation. Download datasheetBeamOn U3 HP: A full-power measurement system based on a high-resolution camera combined with Duma Optronics’ our patented technology of sampling and cooling will measure up to IR wavelengths of 1.6 microns. Download datasheetBeamOn HP: Simplified version of beam analysis when compared to BeamOn U3, offering an excellent price-performance ratio. Download datasheetMicrobeam HP: A unique microbeam analyzer for relatively small focused beams down to less than 5 µm with power levels exceeding 100 W. Download datasheetKey Features: Complete Line of Laser Beam Analyzing Suitable for CW and/or Pulsed Lasers Two Technologies: Tomographic Knife-edge and CCD/CMOS Imaging Systems Wide Range of Beam Sizes: 0.5 to 45,000 µm Broad Wavelength Ranges From UV to 2700 nm High-power (HP) Models Available Full Set of Attachments for M² Measurement and Other Sophisticated Applications Applications: Analyzing CW and Pulsed Laser Beams, Providing Profiles, Beam Size, Beam Position and Real-time Power Measurements. Analyzing Beams With Sizes Ranging From Less Than 0.5 µm up to 45 mm; Analyzing Laser Beams With Power Levels From pW up to Several W, High Power Versions up to 8 kW; Special Versions for Solar Energy