SEBI RT1000 Wavefront Sensor

Wavefront Accuracy <λ/30 RMS; Phase Sampling 1000x1000; Lateral Resolution 12.5 μm; Real-Time Processing 30 fps; Wavelength Range 380-650 nm; USB 3.0

The SEBI® RT1000 is a high-resolution wavefront sensor built for laboratories and production environments that need accurate optical data without the constraints of classical interferometry. Conventional wavefront measurement typically depends on a reference beam and coherent illumination, which adds setup complexity and sensitivity to vibration. The RT1000 works differently: using Wooptix's proprietary WFPI (Wavefront Phase Imaging) technology, it acquires two out-of-focus intensity images through an electrically tunable lens and retrieves the wavefront phase map of the sample under test. This approach works with transparent and reflective samples alike, resolving phase data within the nanometer range, making the RT1000 a practical fit for optical characterization, material inspection, and quality control in both research and industrial settings.

Key features

• A wavefront sensor without a reference beam: WFPI technology retrieves the phase map from two out-of-focus images acquired through an electrically tunable lens, reducing setup complexity and vibration sensitivity compared to interferometric methods.
• Real-time processing at 30 frames per second, with wavefront accuracy below λ/30 RMS and repeatability of approximately λ/30 RMS.
• 1000 × 1000-pixel phase sampling at 12.5 μm lateral resolution across a 15 × 15 mm aperture.
• Operates across a 380-650 nm wavelength range in the visible spectrum.
• USB 3.0 plug-and-play integration into existing setups and equipment, with Windows-based SEBI® Analyzer Suite software for real-time phase and intensity acquisition, optical path difference analysis, and processing such as Zernike coefficient filtering.
• Full documentation package, including installation manuals and application notes.

Applications

As a real-time wavefront sensor for quality control, the RT1000 also supports optical characterization and material inspection on both transparent and reflective samples. That combination makes it applicable across manufacturing and research settings alike, from characterizing optical components to inspecting materials and verifying part quality without dedicated interferometric hardware.

Why buy from AMS Technologies?

• Expert product selection and technical support
• Proven components from qualified suppliers
• Reliable European service and supply
• Custom engineering when standard products are not enough
• One partner from component to complete solution

What's next

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