NOVA Profile Inspection Module

Product number: SW11937

Manufacturer: KrellTech

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NOVA Profile Inspection Module KrellTech Datasheet

Product information "NOVA Profile Inspection Module"

Profile Inspection Microscope Module for NOVA™ Polishing System

As an option for its NOVA™ automated polishing system, KrellTech offers video inspection systems to monitor the polishing process and inspect the polished surface directly in NOVA™.

KrellTech’s NOVA™ profile videoscope allows the real-time monitoring of component polishing. This videoscope aids with bare fiber/component positioning and confirms process completion. Teamed with measurement software, this system verifies the endface geometry of a broad range of photonics components, from optical fibers, waveguides and arrays all the way to inspecting the results of PIC (Photonic Integrated Circuits) post production processing

Applications: Inspecting and verifying the polishing process and the endface geometry of optical fibers, waveguides, arrays and PICs

Manufacturer "KrellTech"

Founded in 1995, KrellTech develops advanced polishing and inspection systems that streamline the entire termination and production process for a multitude of optical applications in fields ranging from telecom to medical, sensing to avionics. KrellTech’s extensive fiber optic experience covers all optical termination disciplines from connectorization through polishing and final testing for bare fiber, connectors and waveguides. Responding to diverse market needs, the company creates solutions that address a range of application requirements from high volume production to the stringent demands of harsh conditions found in industrial and aerospace environments. KrellTech’s patented approach to optical component processing combines polishing with in-line inspection techniques for immediate quality feedback, reduced material handling and increased throughput. Merging several independent production steps, process time is decreased, labour minimized, traceability assured and quality control is maximized.