FQS DPSS Lasers

Actively Q-switched DPSS laser; pulse width <2 ns; repetition rate up to 50 kHz; very low jitter; 1064 nm and harmonics down to 355 nm Utilising advanced technology, SPOT actively Q-switched DPSS lasers provide a short pulse output (pulse widths <2 ns) at repetition rates from single shot up to >50 kHz with very low jitter. The series features fundamental YAG wavelength at 1064 nm and harmonics down to 355 nm. The compact design enables the lasers to be easily integrated into scientific instrumentation. Applications include laser induced fluorescence, time resolved fluorescence, micromachining, biotechnology, plasma generation, remote sensing, photo acoustic imaging, MALDI mass spectrometry and MALDI imaging. SPOT laser systems consist of a laser head with a separate power supply unit. Both units are connected with a cable which is hard wired into the laser head while having a 37 way ‘D’ connector for connection to the power supply unit. The SPOT DPSS laser series feature simple, user-friendly control with the minimum of user defined parameters. The systems are designed as fixed power level devices under automatic operation, or power can be varied by adjusting the pump diode current via RS232 interface. Specifications Wavelength: 1064 nm; 532 nm; 355 nm Pulse Energy: up to 50 µJ Pulse width: <2 ns Low jitter: <±1 ns Repetition rate: up to 50 kHz Spatial Mode: TEM00 M2 < 1.2 Features Low pulse width and jitter RS232 controllable User interface (interlock, on/off keyswitch etc.) Manual safety shutter Active current limit Auto power-up sequence: warmup, current mode Laser diode protection circuitry Monitoring the following parameters:      - Diode current limit, diode current setpoint, actual diode current      - Diode & chipset temperature setpoint, actual temperature Diode-on-time LCD hour counter (internal) Overtemperature Sensors for heatsink and laser-head Applications: Photoacoustic Microscopy; MALDI Mass Spectrometry (Matrix Assisted Laser Desorption Ionisation); Fluorescence Lifetime Imaging (FLIM); Dye Laser Pumping

500 to 1000 nm; Refractive Index Accuracy ±0.0001; Spatial Resolution 500 nm; Fiber Type SM, MM, PM, Other; Fiber Diameter 40 to 400 µm Interfiber Analysis’ IFA-100 multi-wavelength interferometric optical fiber analyzer can measure the refractive index profile of an optical fiber without the need for a cleave at wavelengths from 375 to 2000 nm. By scanning the fiber from the side, the IFA-100 unit allows for scanning and measuring the optical refractive index profile (RIP) along the fiber’s length with sub-micron spatial resolution. The measurement is independent of cumbersome fiber preparation like cleaving and allows for measuring the evolution of the refractive index profile over a given length of fiber. The equipment uses a broadband light source and can determine the refractive index profile at any wavelength between visible and near infrared. The refractive index or index of refraction (IOR) is a property of any material. For optically transmitting materials, such as for fibers and waveguides, it is reflected in the reduced speed of light when travelling through any media other than vacuum. Fibers and waveguides use a distribution of the IOR within their cross section to guide and reflect light, and knowledge of this distribution allows many other critical performance parameters to be calculated, such as mode fields, group and phase propagation constants and fiber dispersion. Based on Interfiber Analysis’ IFA-100 multi-wavelength interferometric optical fiber analyzer, AMS Technologies offers refractive index measurement services for product development, incoming inspection and forensic analysis on optical fibers. Key Features: Multi-wavelength: 500 to 1000 nm No Cleave Required Sub-µm Spatial Resolution: About 500 nm Applicable to Any Fiber Type Fast Measurement Refractive Index Accuracy: ±0.0001 Fiber Diameter: 40 to 400 µm Fiber Material: Silica Glass, Non-silica Glass, Plastic Concentricity Error Measurement: ±200 nm Core Non-circularity Error Measurement: ± 0.4% Fiber Type: Single Mode (SM), Multi Mode (MM), Polarization Maintaining PM), Micro-Structured (PCF), Multicore, Rare-earth, Cladding-pumped, Large Mode Area (LMA), Low Bend Loss, High-Δ, etc. Applications: Measuring Splices, Tapers or Couplers of Any Fiber Type; Test and Measurement; Telecommunication; Lasers