APD Silicon Avalanche Photodiodes

Active Area Diameter 0.8-3 mm; Responsivity 25-36 A/W; Capacitance 2-10 pF; NEP 14-20 fW/√Hz; Dark Current 50, 100 nA; Package TO-5, TO-8 Excelitas’ 1064 nm long-wavelength enhanced Silicon Avalanche Photodiodes (APDs) C30954EH, C30955EH and C30956EH are made using a double-diffused “reach-through” structure. The design of these photodiodes is such that their long-wave response (i.e. >900 nm) has been enhanced without introducing any undesirable properties. The C30954EH, C30955EH and C30956EH long-wavelength enhanced APDs have quantum efficiency of up to 40 % at 1060 nm. At the same time, the diodes retain the low-noise, low-capacitance, and fast rise and fall times characteristics. To help simplify many design needs, these APDs are also available in Excelitas’ high-performance hybrid preamplifier module type C30659 series, as well as the preamplifier and TE cooler incorporated module type LLAM series. In addition, these APDs are also available with built-in thermo-electric cooler for easier temperature control. The C30954EH long-wavelength enhanced silicon avalanche photodiode (Si APD) provides a 0.8 mm active area diameter in a TO-5 package. The C30955EH long-wavelength enhanced silicon avalanche photodiode (Si APD) provides a 1.5 mm active area diameter in a TO-5 package. The C30956EH large-area, long-wavelength enhanced silicon avalanche Photodiode (Si APD) provides a 3 mm active area diameter in a TO-8 package. Key Features: Active Area Diameter: 0.8, 1.5, 3 mm High Quantum Efficiency at 1060 nm: ≤40% Enhanced Long-wave Response: >900 nm Fast Response Time: 2 ns Wide Operating Temperature Range Low Capacitance @100 kHz: 2 to 10 pF Responsivity @1060 nm: 25 to 36 A/W Dark Current: 50, 100 nA Spectral Noise Current: 0.5 pA/√Hz NEP @1060 nm: 14 to 20 fW/√Hz Vop Range: 275 to 425 V Hermetically Sealed Packages: TO-5, TO-8 RoHS Compliant TEC Option Available Customization Available Upon Request Applications: Range Finding; LiDAR (Light Detection and Ranging); YAG Laser Detection

4x4 Array Detector; 810, 850 nm Band Optimized; Active Area 1,0, 1.96 mm2; Responsivity 0.35 to 0.4 A/W; Capacitance 35, 75 pF; Package Ceramic LCC OSI Optoelectronics’ 4X4D series comprise 4 by 4 arrays of super blue enhanced photodetectors. Two models are available: PIN-4X4D silicon array detectors feature an active area of 1.96 mm2 and a peak responsivity wavelength of 850 nm, while UDT-4X4D silicon array detectors with an active area of 1.0 mm2 show peak responsivity at 810 nm. OSI Optoelectronics’ proprietary design provides virtually complete isolation between all of the 16 elements. The standard LCC package allows easy integration into your surface mount applications. Numerous applications include ratio and scattering measurements, as well as Position Sensing. For custom packages, special electro-optic requirements, or to order these parts in die form, please contact AMS Technologies. Key Features: 4x4 Array Detector Active Area: 1.0x1.0 mm (UDT-4X4D), 1.4x1.4 mm (PIN-4X4D) Peak Responsivity Wavelength: 810 (UDT-4X4D), 850 nm (PIN-4X4D) Very Fast Response Extremely Low Cross-talk Surface Mount Design Package: Ceramic LCC Applications: Ratio and Scattering Measurements; Position Sensing

540, 930 nm Band Optimized; 16 Elements; Active Area 2.35 mm2 per Element; AA Dimensions 2.00 x 1.18 mm per Element, Pitch 1.57 mm; Rise Time 0.1 µs; Responsivity 0.31, 0.59 A/W; Capacitance 28 pF; Package Special PCB OSI Optoelectronics' A2C-16-1.57 multi-channel X-ray detector consists 16 individual elements grouped together in an array and mounted on PCB. For X-ray or gamma-ray application, these multi-channel detectors offer scintillator-mounting options: BGO, CdWO4 or CsI(TI). BGO (Bismuth Germanate) acts as an ideal absorber: it is widely accepted in high-energy detection applications. CdWO4 (Cadmium Tungstate) exhibits sufficiently high light output, helping improve spectrometry results. CsI (Cesium Iodide) is another high energy absorber, providing adequate resistance against mechanical shock and thermal stress. When coupled to scintillators, these silicon arrays map any medium or high radiation energy over to visible spectrum via scattering effect. Also, their specially designed PCB allows end-to-end connectivity. Multiple arrays can be deployed in situations that call for larger scale assembly. Key Features: Scintillator Platform 5 V Bias Channel Spacing Variety Applications: Position Sensors; Multi-channel Gamma Counting; X-ray Security Systems

Active Area 0.191-37.7 mm²; Radiometric Sensitivity 0.034-7 A/W; Capacitance 0.15-11 nF; Spectral Range 330-720 nm; Typ. Peak Wavelength 555, 580, 585 nm; NEP 11, 13, 53 fW/√Hz; Max. Dark Current 0.02-50 nA; Package TO-8, TO-46, T-1¾ Flat Excelitas offers ambient light sensors that provide an easy solution for applications requiring a response similar to the human eye, making them ideal when the response should only be influenced by visible light. Within this product family, we offer two types of Excelitas devices: IR-filtered silicon photodiodes and IR-filtered silicon phototransistors. These devices contribute in various applications to energy conservation in both fixed and portable devices. They are available in a number of standard packages, including surface mount for automated assembly. Applications: Interior and Exterior Light Switching (Dusk/Dawn Switch); Interior and Exterior Light Control (Dimming); Automotive Headlight Dimmer; Display Contrast Control; Energy Conservation

800 nm Band Optimized; Active Area 0.003 to 1.77 mm2; AA Dia. 0.2 to 1.5 mm; Responsivity 50 A/W; Capacitance 1.5 to 10 pF; Package TO-5, TO-52 OSI Optoelectronics introduces its APDXX-8-150 “800 nm optimized” silicon avalanche photodiode (APD) series, available in hermetic metal packages. Devices offer lower noise and high sensitivity over bandwidths up to 1 GHz. APDXX-8-150 devices exhibit a low temperature coefficient of 0.45 V/˚C. OSI Optoelectronics’ APD series of silicon avalanche photodiodes make use of internal multiplication to achieve gain due to impact ionization. The result is this optimized series of high responsivity devices, exhibiting excellent sensitivity. The APDXX-8-150 series is available with different active area sizes ranging from 0.2 to 1.5 mm in diameter as well as with flat windows or ball lenses for optical fiber applications. Depending on active area size, the devices are supplied in TO-5, or TO-52 packages. Key Features: Active Area Diameters: 0.2, 0.5, 1.0, 1.5 mm Low Temperature Coefficient: 0.45 V/°C High Sensitivity Low Noise High Bandwidth Applications: Optical Fiber Communication; Laser Range Finder; High-speed Photometry

C30927 Series: Number of Elements 4; Photo Sensitive Diameter 1.5 mm; Responsivity 15-62 A/W; Capacitance 1 pF; NEP 9-16 fW/√Hz; Spectral Noise Current per Element 0.5 pA/√Hz Excelitas’ C30927 family of avalanche photodiode (APD) arrays and quadrants utilize the double-diffused “reach-through“ structure. This structure provides ultra-high sensitivity at 400 nm to 1000 nm. The C30927 quadrant structure has a common avalanche junction, with separation of the quadrants achieved by segmentation of the light entry p+ surface opposite the junction. With this design, there is no dead space between the elements and therefore no loss of response at boresight. The C30927EH-01, -02 and -03 APD arrays and quadrants are optimized for use at wavelengths of 1060, 900, and 800 nm respectively. Each device type will provide high responsivity and excellent performance when operated within about 50 nm of the specified wavelength. The C30985E is a 25-element silicon avalanche photodiode (Si APD) consisting of a double diffused “reach-through” structure. The standard versions of the Excelitas C30737 silicon APD array series are available with 16 or 64 elements and provide high responsivity between 500 nm and 1000nm. The standard versions are available either in a compact surface-mount “top-looking” leadless package (C30737MA) or in a BGA type “top-looking” package (C30737GA). Both packages are ideally suited for high volume, cost-effective applications where a high gain APD is required. The leadless SMD and BGA packaged parts are RoHS-compliant and suitable for reflow soldering. The C30737MH series of LLC SMD packaged EPI APDs has the smallest footprint SMD packages. The C30737GA-02-64-90 silicon avalanche photodiode array (Si APD array) provides high responsivity between 500 nm and 1000 nm and is available in a BGA-type “top-looking” package. The C30737GA is ideally suited for high volume, cost-effective applications where a high gain APD is required. Its leadless BGA package is RoHS-compliant and suitable for reflow soldering. Key Features C30927 Series: High Quantum Efficiency Hermetically Sealed Packages Monolithic Chip With Minimal Dead Space Between Elements Specific Tailored Wavelength Response RoHS Compliant Customization Available Upon Request Applications C30927 Series: Spectroscopy; Particle Detection; Spot Tracking and Alignment Systems; Adaptive Optics; LiDAR (Light Detection and Ranging)

920 nm Band Optimized; Active Area 5.76 to 88.36 mm2; AA Dimensions 2.4 x 2.4 to 9.4 x 9.4 mm; Rise Time 10, 20 ns; Responsivity 0.30 to 0.59 A/W; Capacitance 50 to 900 pF; Package SMT OSI Optoelectronics’ BI-SMT product series are single-channel back-illuminated photodiodes specifically designed to minimize “dead” areas at the edge of the device. Each device is designed on a package with dimensions very similar to the chip itself. This design allows for multiple detectors to be arranged in a tiled format and offers ease of coupling to a scintillator. Key Features: Chip Size Package Easy Coupling to Scintillator Patterned Electrodes Applications: X-Ray Inspection; Computed Tomography; General Industrial Use

410, 436 nm Band Optimized; Active Area 0.81 to 200 mm2; AA Dia. 1.02 to 11.3 mm Round, 1.0 x 1.0 to 10 x 20 mm Rect.; Rise Time 0.02 to 45 µs; Responsivity 0.15 to 0.21 A/W; Capacitance 35 to 17,000 pF; Package TO-5, TO-8, TO-18, BNC, Metal, Plastic, Special OSI Optoelectronics’ blue-enhanced photovoltaic detector series is utilized for applications requiring high sensitivity in the visible-blue region and moderate response speeds. These detectors provide additional sensitivity in the 350 to 550 nm region when compared to the regular photovoltaic devices. For visible and near IR applications i.e. spectral response ranges from 350 to 1100 nm, regular photovoltaic devices can be considered. These detectors feature high shunt resistance and low noise and exhibit long term stability. Unbiased operation of these detectors offers stability under wide temperature variations in DC or low-speed applications. For high light levels (>10mW/cm2), the photoconductive series detectors should be considered for better linearity. These blue-enhanced photovoltaic detectors are not designed to be reverse biased! Very slight improvement in response time may be obtained with a slight bias. Applying a reverse bias of more than a few volts (>3 V) will permanently damage the detectors. If faster response times are required, the photoconductive series should be considered. Please refer to the photovoltaic mode (PV) paragraph in the application note “Photodiode Characteristics and Applications” available under “Downloads” for detailed information on electronics set up. Key Features: Blue Enhanced High Speed Response Low Capacitance Low Dark Current Wide Dynamic Range High Responsivity Ultra Low Noise High Shunt Resistance Applications: Pulse Detectors; Optical Communications; Bar Code Readers; Optical Remote Control; Medical Equipment; High-speed Photometry; Colorimeters; Spectroscopy Equipment; Fluorescence

970 nm Band Optimized; Active Area 7.25 mm2; AA Dimensions 2.69 x 2.69 mm; Rise Time 20 ns; Responsivity 0.15 to 0.60 A/W; Capacitance 12 to 65 pF; Package Plastic Molded OSI Optoelectronics’ BPW-34 series are a family of high quality and reliability plastic encapsulated silicon photodiodes. The devices in this series exhibit similar electrical characteristics, but vary in optical response. BPW-34B has an excellent response in the blue region of the spectrum. BPW-34 series of plastic molded silicon photodiodes are excellent for mounting on PCB and hand-held devices in harsh environments. Key Features: High Reliability High Density Package Rugged Resin Mold High Speed Low Dark Current Applications: IR Sensors; Bar Code Scanners; Color Analysis; Smoke Detectors

550 nm Band Optimized; Active Area 5.7, 100 mm2; AA Dia. 11.28 mm Round, 2.4 x 2.4 mm Square; Rise Time 0.1 to 1.0 µs; Responsivity 0.025 to 0.27 A/W; Capacitance 100 to 1,500 pF; Package TO-5, BNC, Special OSI Optoelectronics’ detector-filter combination series incorporates a filter with a photodiode to achieve a tailored spectral response. OSI Optoelectronics offers a multitude of standard and custom combinations. Upon request, all detector-filter combinations can be provided with NIST-traceable calibration data specified in terms of A/W, A/lm, A/lux or A/fc. Among many possible custom combinations, following are a few detector-filter combinations available as standard parts: PIN-10AP is a 1 cm2 active area, BNC package detector-filter combination which duplicates the response of the most commonly available optical aid, the human eye. The eye senses both brightness and color, with response varying as a function of the wavelength. This response curve is commonly known as the CIE curve. The AP filters accurately match the CIE curve to within 4% of the area. PIN-555AP has the same optical characteristics as the PIN10-AP, with an additional operational amplifier in the same package. The package and the operational amplifier combination is identical to UDT-555D detector-amplifier combination (Photop™). PIN-005E-550F uses a low cost broad-bandpass filter with peak transmission at 550 nm to mimic the CIE curve for photometric applications. The pass band is similar to the CIE curve, but the actual slope of the spectral response curve is quite different. This device can also be used to block the near IR portion of the spectral range, 700 nm and above. PIN-005D-254F is a 6 mm2 active area, UV-enhanced photodiode-filter combination which utilizes a narrow bandpass filter peaking at 254 nm. Key Features: CIE Match (AP Models) Flat Band Response (DF Models) Narrow Bandpass Version Available (254 Models) Hybrid Version With Amplifier Available (PIN-555AP) BNC Packages Available Applications: Analytical Chemistry; Spectrophotometry; Densitometers; Photometry/Radiometry; Medical Instrumentation; Liquid Chromatography

OSI Optoelectronics’ super linear duo-lateral position sensing detectors (PSDs) feature state of the art duo-lateral technology to provide a continuous analog output proportional to the displacement of the centroid of a light spot from the center, on the active area. As continuous position sensors, these detectors are unparalleled, offering position accuracies of 99% over 64% of the sensing area. These accuracies are achieved by duo-lateral technology, manufacturing the detectors with two separate resistive layers, one located on the top and the other at the bottom of the chip. One- or two-dimensional position measurements can be obtained using these sensors. A reverse bias should be applied to these detectors to achieve optimum current linearity at high light levels. The maximum recommended power density incident on the duo-lateral PSDs is 1 mW/cm2. For optimum performance, the incident beam should be perpendicular to the active area, with a spot diameter of less than 1 mm. Key Features: Duo Lateral Structure One-dimensional (SL Variants) and Two-dimensional (DL, DLS Variants) Versions High Speed Response Super Linear Ultra High Position Accuracy: Up to 99% Low Capacitance Low Dark Current Wide Dynamic Range High Reliability Metal or Ceramic Package Applications: Pulse Detectors; Optical Communications; Bar Code Readers; Optical Remote Control; Medical Equipment; High-speed Photometry; Beam Alignment; Position Sensing; Angle Measurement; Surface Profiling; Height Measurements; Targeting; Guidance Systems; Motion Analysis

800, 905 nm; Active Area Diameter 230, 500 µm; Responsivity 50, 55 A/W Typ.; Capacitance 1-3 pF Typ.; Package TO-46 Metal Can, LCC3 SMD, LCC6 SMD EPIGAP Optronic’s EOAPD series of silicon avalanche photodiodes (APD) provide an internal gain mechanism, fast time response, low dark current and high sensitivity in the near infrared region. These APDs are recommended for applications that require high bandwidth, or where internal gain is needed to overcome high pre-amp noise. In addition, they provide higher sensitivity than standard photodiodes like EPIGAP Optronic’s EOPD series and are ideal for extreme low-level light detection and short pulse detection. Silicon avalanche photodiodes (Si APDs) are the preferred optical detectors for applications with wavelengths between 400 nm and 1100 nm. Standard versions are available in active area sizes with a diameter of 230 µm and 500 µm and are offered in hermetic TO cans and LCC packages. These detectors have become the semiconductor equivalent of photomultipliers in many applications including data communication, LIDAR, instrumentation and photon counting. Key Features: Product Peak Wavelength Active Area Package Downloads EOAPD-800-0-04 800 nm Ø 230 µm TO-46 Metal Can Datasheet EOAPD-800-0-08 800 nm Ø 500 µm TO-46 Metal Can Datasheet EOAPD-800-1-01 800 nm Ø 230 µm LCC3 SMD Datasheet EOAPD-800-1-05 800 nm Ø 500 µm LCC3 SMD Datasheet EOAPD-800-1-07 800 nm Ø 500 µm LCC6 SMD Datasheet EOAPD-905-0-12 905 nm Ø 230 µm TO-46 Metal Can Datasheet EOAPD-905-0-16 905 nm Ø 500 µm TO-46 Metal Can Datasheet EOAPD-905-1-09 905 nm Ø 230 µm LCC3 SMD Datasheet EOAPD-905-1-13 905 nm Ø 500 µm LCC3 SMD Datasheet EOAPD-905-1-15 905 nm Ø 500 µm LCC6 SMD Datasheet   Applications: Data Communication; LIDAR; Instrumentation; Photon Counting; Optical Range Finders; High-speed Optical Communications; Medical Equipment; Barcode Readers